Method and Apparatus for Broadcasting Scan Patterns in a Scan-Based Integrated Circuit

A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The br...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG HSIN-PO, WANG LAUNG-TERNG
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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