SENSE AMPLIFIER SOFT-FAIL DETECTION CIRCUIT
Embodiments of a sense amplifier test circuit are disclosed that may allow for detecting soft failures. The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. The voltage generator may be operable to controllably supply different differe...
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creator | BURNETTE, II JAMES E HESS GREG M |
description | Embodiments of a sense amplifier test circuit are disclosed that may allow for detecting soft failures. The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. The voltage generator may be operable to controllably supply different differential voltages to the sense amplifier, and the detection circuit may be operable to detect an analog voltage on the output of the sense amplifier. |
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The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. 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The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. The voltage generator may be operable to controllably supply different differential voltages to the sense amplifier, and the detection circuit may be operable to detect an analog voltage on the output of the sense amplifier.</description><subject>AMPLIFIERS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAOdvULdlVw9A3w8XTzdA1SCPZ3C9F1c_T0UXBxDXF1DvH091Nw9gxyDvUM4WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgaGJoZGZsaGRo6GxsSpAgADDCXA</recordid><startdate>20140508</startdate><enddate>20140508</enddate><creator>BURNETTE, II JAMES E</creator><creator>HESS GREG M</creator><scope>EVB</scope></search><sort><creationdate>20140508</creationdate><title>SENSE AMPLIFIER SOFT-FAIL DETECTION CIRCUIT</title><author>BURNETTE, II JAMES E ; HESS GREG M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014126312A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>AMPLIFIERS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BURNETTE, II JAMES E</creatorcontrib><creatorcontrib>HESS GREG M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BURNETTE, II JAMES E</au><au>HESS GREG M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SENSE AMPLIFIER SOFT-FAIL DETECTION CIRCUIT</title><date>2014-05-08</date><risdate>2014</risdate><abstract>Embodiments of a sense amplifier test circuit are disclosed that may allow for detecting soft failures. The sense amplifier test circuit may include a voltage generator circuit, a sense amplifier, and a detection circuit. The voltage generator may be operable to controllably supply different differential voltages to the sense amplifier, and the detection circuit may be operable to detect an analog voltage on the output of the sense amplifier.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | AMPLIFIERS BASIC ELECTRONIC CIRCUITRY ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING |
title | SENSE AMPLIFIER SOFT-FAIL DETECTION CIRCUIT |
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