AUTOMATIC WAFER DATA SAMPLE PLANNING AND REVIEW

A method of constructing a mask for use in semiconductor device manufacturing is disclosed. A first shape that is related to mask construction is selected from a set of shapes. A second shape related to the mask construction is selected from the set of shapes. The first shape and the second shape ar...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LUIJTEN RONALD P, CASATI NATHALIE, GABRANI MARIA, DEMARIS DAVID
Format: Patent
Sprache:eng
Schlagworte:
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