METHOD AND SYSTEM FOR SIGNAL GENERATION VIA A TEMPERATURE SENSING CRYSTAL INTEGRATED CIRCUIT
Disclosed are various embodiments involving correction of signals generated by a crystal oscillator. An age of an integrated circuit or a time of use of the integrated circuit may be determined. A signal generated from a crystal of the integrated circuit may be modified based at least in part on the...
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| creator | IBRAHIM AMIR WELZ JARED KANEKAL SUNIL WALLEY JOHN MCCARTHY EVAN HYUN-GYU JEON |
| description | Disclosed are various embodiments involving correction of signals generated by a crystal oscillator. An age of an integrated circuit or a time of use of the integrated circuit may be determined. A signal generated from a crystal of the integrated circuit may be modified based at least in part on the determined age of the integrated circuit or the determined time of use of the integrated circuit. |
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An age of an integrated circuit or a time of use of the integrated circuit may be determined. A signal generated from a crystal of the integrated circuit may be modified based at least in part on the determined age of the integrated circuit or the determined time of use of the integrated circuit.</description><language>eng</language><subject>ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140213&DB=EPODOC&CC=US&NR=2014046607A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140213&DB=EPODOC&CC=US&NR=2014046607A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>IBRAHIM AMIR</creatorcontrib><creatorcontrib>WELZ JARED</creatorcontrib><creatorcontrib>KANEKAL SUNIL</creatorcontrib><creatorcontrib>WALLEY JOHN</creatorcontrib><creatorcontrib>MCCARTHY EVAN</creatorcontrib><creatorcontrib>HYUN-GYU JEON</creatorcontrib><title>METHOD AND SYSTEM FOR SIGNAL GENERATION VIA A TEMPERATURE SENSING CRYSTAL INTEGRATED CIRCUIT</title><description>Disclosed are various embodiments involving correction of signals generated by a crystal oscillator. 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A signal generated from a crystal of the integrated circuit may be modified based at least in part on the determined age of the integrated circuit or the determined time of use of the integrated circuit.</description><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi0EKwjAQRbNxIeodBlwLqZZ2HZJpOmAnkqSCIJQicSVaqPfHCB7A1Yf33l-Ka4exdQYUGwiXELGDxnkIZFkdwSKjV5Ecw5kUKMj-9CW9RwjIgdiC9vmXY-KINjs0oMnrnuJaLO7jY06b367EtsGo212aXkOap_GWnuk99GEvi1KWVSVrVRz-qz6GAjNf</recordid><startdate>20140213</startdate><enddate>20140213</enddate><creator>IBRAHIM AMIR</creator><creator>WELZ JARED</creator><creator>KANEKAL SUNIL</creator><creator>WALLEY JOHN</creator><creator>MCCARTHY EVAN</creator><creator>HYUN-GYU JEON</creator><scope>EVB</scope></search><sort><creationdate>20140213</creationdate><title>METHOD AND SYSTEM FOR SIGNAL GENERATION VIA A TEMPERATURE SENSING CRYSTAL INTEGRATED CIRCUIT</title><author>IBRAHIM AMIR ; WELZ JARED ; KANEKAL SUNIL ; WALLEY JOHN ; MCCARTHY EVAN ; HYUN-GYU JEON</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2014046607A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>IBRAHIM AMIR</creatorcontrib><creatorcontrib>WELZ JARED</creatorcontrib><creatorcontrib>KANEKAL SUNIL</creatorcontrib><creatorcontrib>WALLEY JOHN</creatorcontrib><creatorcontrib>MCCARTHY EVAN</creatorcontrib><creatorcontrib>HYUN-GYU JEON</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>IBRAHIM AMIR</au><au>WELZ JARED</au><au>KANEKAL SUNIL</au><au>WALLEY JOHN</au><au>MCCARTHY EVAN</au><au>HYUN-GYU JEON</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR SIGNAL GENERATION VIA A TEMPERATURE SENSING CRYSTAL INTEGRATED CIRCUIT</title><date>2014-02-13</date><risdate>2014</risdate><abstract>Disclosed are various embodiments involving correction of signals generated by a crystal oscillator. An age of an integrated circuit or a time of use of the integrated circuit may be determined. A signal generated from a crystal of the integrated circuit may be modified based at least in part on the determined age of the integrated circuit or the determined time of use of the integrated circuit.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | METHOD AND SYSTEM FOR SIGNAL GENERATION VIA A TEMPERATURE SENSING CRYSTAL INTEGRATED CIRCUIT |
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