Method and Apparatus for Testing a Semiconductor Device

The present disclosure provides a method for testing a semiconductor device. The method includes providing a testing unit and an electronic circuit coupled to the testing unit and applying a first electrical signal to the testing unit. The method includes sweeping a second electrical signal across a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SHAO JHIH JIE, CHUNG TANG-HSUAN, HUANG SUZIA, TSENG HUAN CHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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