Capacitive Analysis of a Moving Test Material

Capacitive Analysis of a Moving Test Material

The capacitive measuring circuit for a moved elongated test material contains at least two measuring capacitors, each of which is configured for receiving the test material. It further contains electrically actuatable selection means, by means of which one of the measuring capacitors can be selected...

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Hauptverfasser: GEHRIG RETO, KOLLER BEAT, BLEISCH KARL
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator GEHRIG RETO
KOLLER BEAT
BLEISCH KARL
description The capacitive measuring circuit for a moved elongated test material contains at least two measuring capacitors, each of which is configured for receiving the test material. It further contains electrically actuatable selection means, by means of which one of the measuring capacitors can be selected in such a way that only the selected measuring capacitor contributes to the measurement, whereas the other measuring capacitors do not. As a result, the total capacitance of the measuring circuit is reduced and its sensitivity is increased.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Capacitive Analysis of a Moving Test Material
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