Techniques for Electromigration Stress Determination in Interconnects of an Integrated Circuit

In one or more embodiments, one or more methods, processes, and/or systems described can determine stress failures in interconnect segments of integrated circuit designs and correct those failure via modifying the interconnect segments of the integrated circuit designs with one or more additions to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DEMIRCAN ERTUGRUL, SHROFF MEHUL D
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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