STRESS-BASED TECHNIQUES FOR DETECTING AN IMMINENT READ FAILURE IN A NON-VOLATILE MEMORY ARRAY

A technique for detecting an imminent read failure in a non-volatile memory array includes applying a bulk read stress to a plurality of cells of the non-volatile memory array and determining whether the plurality of cells exhibit an uncorrectable error correcting code (ECC) read during an array int...

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Hauptverfasser:	EGUCHI RICHARD K, HE CHEN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS STATIC STORES
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creator	EGUCHI RICHARD K HE CHEN
description	A technique for detecting an imminent read failure in a non-volatile memory array includes applying a bulk read stress to a plurality of cells of the non-volatile memory array and determining whether the plurality of cells exhibit an uncorrectable error correcting code (ECC) read during an array integrity check at a margin read verify voltage level subsequent to the bulk read stress. The technique also includes providing an indication of an imminent read failure for the plurality of cells when the plurality of cells exhibit the uncorrectable ECC read during the array integrity check. In this case, the margin read verify voltage level is different from a normal read verify voltage level.
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The technique also includes providing an indication of an imminent read failure for the plurality of cells when the plurality of cells exhibit the uncorrectable ECC read during the array integrity check. 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subjects	BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS STATIC STORES
title	STRESS-BASED TECHNIQUES FOR DETECTING AN IMMINENT READ FAILURE IN A NON-VOLATILE MEMORY ARRAY
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