MICROMETER

A micrometer includes: a frame; an anvil; a spindle; an encoder; a display; a strain gauge that detects a deformation of the frame; a storage that stores a change amount of the detection value (a displacement of the spindle detected by the encoder) per a unit deformation detected by the strain gauge...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	TSUJI SHOZABURO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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