BEAM MONITOR SYSTEM AND PARTICLE BEAM IRRADIATION SYSTEM

Disclosed is a beam monitor system in which signals outputted from a plurality of wires are divided in a multi-wire type monitor for measuring a beam profile of a charged particle beam, an identical number of the wires are grouped, the signals of the respective groups are taken out one piece by one...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TADOKORO MASAHIRO, MORIYAMA KUNIO, HORI YOSHIHITO, MATSUSHITA TAKAYOSHI, IWAMOTO TOMOHISA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!