PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS

A test system for testing prototype designs includes a host workstation, multiple interface devices, and multiple prototype boards. The prototype boards include programmable devices which implement one or more partitions of a user design and an associated verification modules. The verification modul...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHANG YINGTSAI, WANG MING YANG, SHEI SWEYYAN, MAO HWA, HSU YUCHIN, CHIU HUNGUN, LIN MENGYI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator CHANG YINGTSAI
WANG MING YANG
SHEI SWEYYAN
MAO HWA
HSU YUCHIN
CHIU HUNGUN
LIN MENGYI
description A test system for testing prototype designs includes a host workstation, multiple interface devices, and multiple prototype boards. The prototype boards include programmable devices which implement one or more partitions of a user design and an associated verification modules. The verification modules probe signals of the partitions and transmit the probed signals to the interface devices. The verification modules can also transmit output signals generated by one or more partitions on the prototype boards to the host workstation via the interface devices, and transmit input signals, which are received from the host workstation via the interface devices, to one or more partitions on the prototype boards.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2013227509A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2013227509A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2013227509A13</originalsourceid><addsrcrecordid>eNrjZHAOCPIP8Q-JDHBVcPRzUXD1DfVxDPH091MIjgwOcfVVcPMPUgCKhXgG-LgqOIcGh_j7KiC0OPk7BrkE8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDYyMjc1MDS0dDY-JUAQAwqC0X</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS</title><source>esp@cenet</source><creator>CHANG YINGTSAI ; WANG MING YANG ; SHEI SWEYYAN ; MAO HWA ; HSU YUCHIN ; CHIU HUNGUN ; LIN MENGYI</creator><creatorcontrib>CHANG YINGTSAI ; WANG MING YANG ; SHEI SWEYYAN ; MAO HWA ; HSU YUCHIN ; CHIU HUNGUN ; LIN MENGYI</creatorcontrib><description>A test system for testing prototype designs includes a host workstation, multiple interface devices, and multiple prototype boards. The prototype boards include programmable devices which implement one or more partitions of a user design and an associated verification modules. The verification modules probe signals of the partitions and transmit the probed signals to the interface devices. The verification modules can also transmit output signals generated by one or more partitions on the prototype boards to the host workstation via the interface devices, and transmit input signals, which are received from the host workstation via the interface devices, to one or more partitions on the prototype boards.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130829&amp;DB=EPODOC&amp;CC=US&amp;NR=2013227509A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130829&amp;DB=EPODOC&amp;CC=US&amp;NR=2013227509A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHANG YINGTSAI</creatorcontrib><creatorcontrib>WANG MING YANG</creatorcontrib><creatorcontrib>SHEI SWEYYAN</creatorcontrib><creatorcontrib>MAO HWA</creatorcontrib><creatorcontrib>HSU YUCHIN</creatorcontrib><creatorcontrib>CHIU HUNGUN</creatorcontrib><creatorcontrib>LIN MENGYI</creatorcontrib><title>PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS</title><description>A test system for testing prototype designs includes a host workstation, multiple interface devices, and multiple prototype boards. The prototype boards include programmable devices which implement one or more partitions of a user design and an associated verification modules. The verification modules probe signals of the partitions and transmit the probed signals to the interface devices. The verification modules can also transmit output signals generated by one or more partitions on the prototype boards to the host workstation via the interface devices, and transmit input signals, which are received from the host workstation via the interface devices, to one or more partitions on the prototype boards.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOCPIP8Q-JDHBVcPRzUXD1DfVxDPH091MIjgwOcfVVcPMPUgCKhXgG-LgqOIcGh_j7KiC0OPk7BrkE8zCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwNDYyMjc1MDS0dDY-JUAQAwqC0X</recordid><startdate>20130829</startdate><enddate>20130829</enddate><creator>CHANG YINGTSAI</creator><creator>WANG MING YANG</creator><creator>SHEI SWEYYAN</creator><creator>MAO HWA</creator><creator>HSU YUCHIN</creator><creator>CHIU HUNGUN</creator><creator>LIN MENGYI</creator><scope>EVB</scope></search><sort><creationdate>20130829</creationdate><title>PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS</title><author>CHANG YINGTSAI ; WANG MING YANG ; SHEI SWEYYAN ; MAO HWA ; HSU YUCHIN ; CHIU HUNGUN ; LIN MENGYI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2013227509A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>CHANG YINGTSAI</creatorcontrib><creatorcontrib>WANG MING YANG</creatorcontrib><creatorcontrib>SHEI SWEYYAN</creatorcontrib><creatorcontrib>MAO HWA</creatorcontrib><creatorcontrib>HSU YUCHIN</creatorcontrib><creatorcontrib>CHIU HUNGUN</creatorcontrib><creatorcontrib>LIN MENGYI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHANG YINGTSAI</au><au>WANG MING YANG</au><au>SHEI SWEYYAN</au><au>MAO HWA</au><au>HSU YUCHIN</au><au>CHIU HUNGUN</au><au>LIN MENGYI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS</title><date>2013-08-29</date><risdate>2013</risdate><abstract>A test system for testing prototype designs includes a host workstation, multiple interface devices, and multiple prototype boards. The prototype boards include programmable devices which implement one or more partitions of a user design and an associated verification modules. The verification modules probe signals of the partitions and transmit the probed signals to the interface devices. The verification modules can also transmit output signals generated by one or more partitions on the prototype boards to the host workstation via the interface devices, and transmit input signals, which are received from the host workstation via the interface devices, to one or more partitions on the prototype boards.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2013227509A1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title PROTOTYPE AND EMULATION SYSTEM FOR MULTIPLE CUSTOM PROTOTYPE BOARDS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T16%3A15%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHANG%20YINGTSAI&rft.date=2013-08-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2013227509A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true