SEMICONDUCTOR INTEGRATED CIRCUIT, MAGNETIC DETECTING DEVICE, ELECTRONIC COMPASS, AND AMMETER

SEMICONDUCTOR INTEGRATED CIRCUIT, MAGNETIC DETECTING DEVICE, ELECTRONIC COMPASS, AND AMMETER

A semiconductor integrated circuit includes a clock-signal control circuit controlling intensity-signal output, which is output from a signal processing circuit, to be stopped in at least a forward outage time and a backward outage time. The forward outage time is previous to an apex point of a tria...

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1. Verfasser: ITOI KAZUHISA
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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description A semiconductor integrated circuit includes a clock-signal control circuit controlling intensity-signal output, which is output from a signal processing circuit, to be stopped in at least a forward outage time and a backward outage time. The forward outage time is previous to an apex point of a triangular wave and having 1 to 5% of a triangular wave period. The backward outage time is subsequent to the apex point of the triangular wave and having 1 to 5% of a triangular wave period.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title SEMICONDUCTOR INTEGRATED CIRCUIT, MAGNETIC DETECTING DEVICE, ELECTRONIC COMPASS, AND AMMETER
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