BUILT-IN SELF-TEST CIRCUIT APPLIED TO HIGH SPEED I/O PORT

A built-in self-test circuit (BIST) applied to a high speed I/O port is provided. The BIST circuit includes a detecting unit, a flag unit and a selecting unit. The detecting unit has a first input terminal for receiving a serial output signal, a second input terminal for receiving a serial enable si...

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Bibliographische Detailangaben

Hauptverfasser:	CHEN YU-LIN, CHEN CHUNGING, LIU HSIAN-FENG
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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