MAPPING CIRCUIT TEST LOGIC BY ANALYZING REGISTER TRANSFER LEVEL CIRCUIT MODELS

Methods and systems for mapping and programming the debug logic of a circuit are provided. The system acquires a Register Transfer Level (RTL) representation of a circuit, wherein the circuit implements test logic that is externally programmable for providing one or more output signals corresponding...

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Bibliographische Detailangaben

1. Verfasser:	SINYKIN JOSHUA P
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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