PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES

Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZURAWSKI JOHN H, JONES KEITH A, PFUNDER DANIEL R
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ZURAWSKI JOHN H
JONES KEITH A
PFUNDER DANIEL R
description Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2013124934A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2013124934A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2013124934A13</originalsourceid><addsrcrecordid>eNrjZDAJcHT2dg3xjPL0c1fwCnF0V3B0DvIPDlbw9HMJDQ4JilQIDnH0c3EMcgGKhLgGuTk6uwbzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjA0NjQyMTS2MTR0Nj4lQBAIEbKIo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES</title><source>esp@cenet</source><creator>ZURAWSKI JOHN H ; JONES KEITH A ; PFUNDER DANIEL R</creator><creatorcontrib>ZURAWSKI JOHN H ; JONES KEITH A ; PFUNDER DANIEL R</creatorcontrib><description>Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130516&amp;DB=EPODOC&amp;CC=US&amp;NR=2013124934A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130516&amp;DB=EPODOC&amp;CC=US&amp;NR=2013124934A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZURAWSKI JOHN H</creatorcontrib><creatorcontrib>JONES KEITH A</creatorcontrib><creatorcontrib>PFUNDER DANIEL R</creatorcontrib><title>PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES</title><description>Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAJcHT2dg3xjPL0c1fwCnF0V3B0DvIPDlbw9HMJDQ4JilQIDnH0c3EMcgGKhLgGuTk6uwbzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjA0NjQyMTS2MTR0Nj4lQBAIEbKIo</recordid><startdate>20130516</startdate><enddate>20130516</enddate><creator>ZURAWSKI JOHN H</creator><creator>JONES KEITH A</creator><creator>PFUNDER DANIEL R</creator><scope>EVB</scope></search><sort><creationdate>20130516</creationdate><title>PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES</title><author>ZURAWSKI JOHN H ; JONES KEITH A ; PFUNDER DANIEL R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2013124934A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZURAWSKI JOHN H</creatorcontrib><creatorcontrib>JONES KEITH A</creatorcontrib><creatorcontrib>PFUNDER DANIEL R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZURAWSKI JOHN H</au><au>JONES KEITH A</au><au>PFUNDER DANIEL R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES</title><date>2013-05-16</date><risdate>2013</risdate><abstract>Apparatus and techniques for performing JTAG testing on production devices and systems through industry standard interfaces. The devices employ processors configured to receive packetized test input data from a tester over a standard communication interface such as a USB or Ethernet port and perform associated testing operations defined by the test input data, such as JTAG-compliant testing. This is facilitated, in part, via use of a bridge and one or more DFx handlers, with the bridge operating as an interface between the DFx handlers and a bus and/or interconnect over which test input and result data is transferred via the standard communication interface. The techniques enable testing such as JTAG testing to be performed on fully-assembled devices and systems without requiring the use of dedicated test or debug ports.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2013124934A1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title PACKETIZING JTAG ACROSS INDUSTRY STANDARD INTERFACES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T05%3A12%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZURAWSKI%20JOHN%20H&rft.date=2013-05-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2013124934A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true