HETEROGENEOUS MULTI-CORE INTEGRATED CIRCUIT AND METHOD FOR DEBUGGING SAME

A heterogeneous multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected to corresponding first and second debug ports by way of corresponding first and second TAP controllers....

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MCGOWAN ROBERT A, DEOGHARIA AMAR NATH, EHRLICH ROBERT N
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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