METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE

In a method for acquiring process parameters for a film, a computer divides parameter sets into a training data group and a test data group. Then, the computer inputs the training data group to a neural network (NN) so as to obtain relationship among parameter sets of the training data group and tra...

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Hauptverfasser: HWANG REYUE, HUANG DU-JOU, YANG JEN-PIN
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creator HWANG REYUE
HUANG DU-JOU
YANG JEN-PIN
description In a method for acquiring process parameters for a film, a computer divides parameter sets into a training data group and a test data group. Then, the computer inputs the training data group to a neural network (NN) so as to obtain relationship among parameter sets of the training data group and transmittances, and uses the test data group to estimate accuracy of the NN. Further, the computer modifies the NN until an error value of estimated parameters, which are acquired by the NN according to the obtained relationship, is smaller than a predetermined value, and uses the NN to acquire practical parameters corresponding to a target transmittance when the error value is smaller than the predetermined value.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2013085972A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2013085972A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2013085972A13</originalsourceid><addsrcrecordid>eNrjZPDzdQ3x8HdRcPMPUnB0Dgz1DPL0c1cICPJ3dg0OVghwDHIEKnANCoYoUHDz9PFVCPcM8QCyQxyD3F1DFEKCHP2CfT1DQhz9nF15GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaGxgYWppbmRo6ExcaoAxKMvYg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE</title><source>esp@cenet</source><creator>HWANG REYUE ; HUANG DU-JOU ; YANG JEN-PIN</creator><creatorcontrib>HWANG REYUE ; HUANG DU-JOU ; YANG JEN-PIN</creatorcontrib><description>In a method for acquiring process parameters for a film, a computer divides parameter sets into a training data group and a test data group. Then, the computer inputs the training data group to a neural network (NN) so as to obtain relationship among parameter sets of the training data group and transmittances, and uses the test data group to estimate accuracy of the NN. Further, the computer modifies the NN until an error value of estimated parameters, which are acquired by the NN according to the obtained relationship, is smaller than a predetermined value, and uses the NN to acquire practical parameters corresponding to a target transmittance when the error value is smaller than the predetermined value.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; PHYSICS</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130404&amp;DB=EPODOC&amp;CC=US&amp;NR=2013085972A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130404&amp;DB=EPODOC&amp;CC=US&amp;NR=2013085972A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HWANG REYUE</creatorcontrib><creatorcontrib>HUANG DU-JOU</creatorcontrib><creatorcontrib>YANG JEN-PIN</creatorcontrib><title>METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE</title><description>In a method for acquiring process parameters for a film, a computer divides parameter sets into a training data group and a test data group. Then, the computer inputs the training data group to a neural network (NN) so as to obtain relationship among parameter sets of the training data group and transmittances, and uses the test data group to estimate accuracy of the NN. Further, the computer modifies the NN until an error value of estimated parameters, which are acquired by the NN according to the obtained relationship, is smaller than a predetermined value, and uses the NN to acquire practical parameters corresponding to a target transmittance when the error value is smaller than the predetermined value.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDzdQ3x8HdRcPMPUnB0Dgz1DPL0c1cICPJ3dg0OVghwDHIEKnANCoYoUHDz9PFVCPcM8QCyQxyD3F1DFEKCHP2CfT1DQhz9nF15GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgaGxgYWppbmRo6ExcaoAxKMvYg</recordid><startdate>20130404</startdate><enddate>20130404</enddate><creator>HWANG REYUE</creator><creator>HUANG DU-JOU</creator><creator>YANG JEN-PIN</creator><scope>EVB</scope></search><sort><creationdate>20130404</creationdate><title>METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE</title><author>HWANG REYUE ; HUANG DU-JOU ; YANG JEN-PIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2013085972A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>HWANG REYUE</creatorcontrib><creatorcontrib>HUANG DU-JOU</creatorcontrib><creatorcontrib>YANG JEN-PIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HWANG REYUE</au><au>HUANG DU-JOU</au><au>YANG JEN-PIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE</title><date>2013-04-04</date><risdate>2013</risdate><abstract>In a method for acquiring process parameters for a film, a computer divides parameter sets into a training data group and a test data group. Then, the computer inputs the training data group to a neural network (NN) so as to obtain relationship among parameter sets of the training data group and transmittances, and uses the test data group to estimate accuracy of the NN. Further, the computer modifies the NN until an error value of estimated parameters, which are acquired by the NN according to the obtained relationship, is smaller than a predetermined value, and uses the NN to acquire practical parameters corresponding to a target transmittance when the error value is smaller than the predetermined value.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
title METHOD FOR ACQUIRING PROCESS PARAMETERS FOR A FILM WITH A TARGET TRANSMITTANCE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T05%3A17%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HWANG%20REYUE&rft.date=2013-04-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2013085972A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true