SYSTEMS FOR INSPECTION OF SHROUDS
A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.
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| creator | ANDARAWIS EMAD ANDARAWIS UMEH CHUKWUELOKA OBIORA |
| description | A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2013002270A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2013002270A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2013002270A13</originalsourceid><addsrcrecordid>eNrjZFAMjgwOcfUNVnDzD1Lw9AsOcHUO8fT3U_B3Uwj2CPIPdQnmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBobGBgZGRuYGjobGxKkCALYHIzY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEMS FOR INSPECTION OF SHROUDS</title><source>esp@cenet</source><creator>ANDARAWIS EMAD ANDARAWIS ; UMEH CHUKWUELOKA OBIORA</creator><creatorcontrib>ANDARAWIS EMAD ANDARAWIS ; UMEH CHUKWUELOKA OBIORA</creatorcontrib><description>A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING ELECTRIC VARIABLES ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130103&DB=EPODOC&CC=US&NR=2013002270A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130103&DB=EPODOC&CC=US&NR=2013002270A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ANDARAWIS EMAD ANDARAWIS</creatorcontrib><creatorcontrib>UMEH CHUKWUELOKA OBIORA</creatorcontrib><title>SYSTEMS FOR INSPECTION OF SHROUDS</title><description>A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAMjgwOcfUNVnDzD1Lw9AsOcHUO8fT3U_B3Uwj2CPIPdQnmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBobGBgZGRuYGjobGxKkCALYHIzY</recordid><startdate>20130103</startdate><enddate>20130103</enddate><creator>ANDARAWIS EMAD ANDARAWIS</creator><creator>UMEH CHUKWUELOKA OBIORA</creator><scope>EVB</scope></search><sort><creationdate>20130103</creationdate><title>SYSTEMS FOR INSPECTION OF SHROUDS</title><author>ANDARAWIS EMAD ANDARAWIS ; UMEH CHUKWUELOKA OBIORA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2013002270A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ANDARAWIS EMAD ANDARAWIS</creatorcontrib><creatorcontrib>UMEH CHUKWUELOKA OBIORA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ANDARAWIS EMAD ANDARAWIS</au><au>UMEH CHUKWUELOKA OBIORA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS FOR INSPECTION OF SHROUDS</title><date>2013-01-03</date><risdate>2013</risdate><abstract>A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
| recordid | cdi_epo_espacenet_US2013002270A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | SYSTEMS FOR INSPECTION OF SHROUDS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T06%3A01%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ANDARAWIS%20EMAD%20ANDARAWIS&rft.date=2013-01-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2013002270A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |