Bad Column Management with Bit Information in Non-Volatile Memory Systems

Column based defect management techniques are presented. Each column of the memory has an associated isolation latch or register whose value indicates whether the column is defective, but in addition to this information, for columns marked as defective, additional information is used to indicate whe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LI YAN, KIM KWANG-HO, BOTTELLI ALDO, TSAI FRANK W
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!