Testing Lifecycle

Systems and methods for testing in a testing lifecycle are described herein. In one embodiment, the testing system includes an extraction module to extract at least one test case pertaining to a requirement associated with a first build, a modified requirement and an incremental requirement associat...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	NOEL RUBY FELECIA, ARUMUGHAM PRABHU, RAJU BHANU, AUGUSTINE NISHA, SUBRAMANIAM PRABHU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	NOEL RUBY FELECIA ARUMUGHAM PRABHU RAJU BHANU AUGUSTINE NISHA SUBRAMANIAM PRABHU
description	Systems and methods for testing in a testing lifecycle are described herein. In one embodiment, the testing system includes an extraction module to extract at least one test case pertaining to a requirement associated with a first build, a modified requirement and an incremental requirement associated with an updated build. Further, an execution module executes the extracted test cases on the build to verify the requirement associated with the build.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2012198421A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2012198421A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2012198421A13</originalsourceid><addsrcrecordid>eNrjZBAMSS0uycxLV_DJTEtNrkzOSeVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhkaGlhYmRoaOhsbEqQIASOsgdg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing Lifecycle</title><source>esp@cenet</source><creator>NOEL RUBY FELECIA ; ARUMUGHAM PRABHU ; RAJU BHANU ; AUGUSTINE NISHA ; SUBRAMANIAM PRABHU</creator><creatorcontrib>NOEL RUBY FELECIA ; ARUMUGHAM PRABHU ; RAJU BHANU ; AUGUSTINE NISHA ; SUBRAMANIAM PRABHU</creatorcontrib><description>Systems and methods for testing in a testing lifecycle are described herein. In one embodiment, the testing system includes an extraction module to extract at least one test case pertaining to a requirement associated with a first build, a modified requirement and an incremental requirement associated with an updated build. Further, an execution module executes the extracted test cases on the build to verify the requirement associated with the build.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120802&DB=EPODOC&CC=US&NR=2012198421A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120802&DB=EPODOC&CC=US&NR=2012198421A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOEL RUBY FELECIA</creatorcontrib><creatorcontrib>ARUMUGHAM PRABHU</creatorcontrib><creatorcontrib>RAJU BHANU</creatorcontrib><creatorcontrib>AUGUSTINE NISHA</creatorcontrib><creatorcontrib>SUBRAMANIAM PRABHU</creatorcontrib><title>Testing Lifecycle</title><description>Systems and methods for testing in a testing lifecycle are described herein. In one embodiment, the testing system includes an extraction module to extract at least one test case pertaining to a requirement associated with a first build, a modified requirement and an incremental requirement associated with an updated build. Further, an execution module executes the extracted test cases on the build to verify the requirement associated with the build.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAMSS0uycxLV_DJTEtNrkzOSeVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhkaGlhYmRoaOhsbEqQIASOsgdg</recordid><startdate>20120802</startdate><enddate>20120802</enddate><creator>NOEL RUBY FELECIA</creator><creator>ARUMUGHAM PRABHU</creator><creator>RAJU BHANU</creator><creator>AUGUSTINE NISHA</creator><creator>SUBRAMANIAM PRABHU</creator><scope>EVB</scope></search><sort><creationdate>20120802</creationdate><title>Testing Lifecycle</title><author>NOEL RUBY FELECIA ; ARUMUGHAM PRABHU ; RAJU BHANU ; AUGUSTINE NISHA ; SUBRAMANIAM PRABHU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2012198421A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>NOEL RUBY FELECIA</creatorcontrib><creatorcontrib>ARUMUGHAM PRABHU</creatorcontrib><creatorcontrib>RAJU BHANU</creatorcontrib><creatorcontrib>AUGUSTINE NISHA</creatorcontrib><creatorcontrib>SUBRAMANIAM PRABHU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOEL RUBY FELECIA</au><au>ARUMUGHAM PRABHU</au><au>RAJU BHANU</au><au>AUGUSTINE NISHA</au><au>SUBRAMANIAM PRABHU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing Lifecycle</title><date>2012-08-02</date><risdate>2012</risdate><abstract>Systems and methods for testing in a testing lifecycle are described herein. In one embodiment, the testing system includes an extraction module to extract at least one test case pertaining to a requirement associated with a first build, a modified requirement and an incremental requirement associated with an updated build. Further, an execution module executes the extracted test cases on the build to verify the requirement associated with the build.</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_US2012198421A1
source	esp@cenet
subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
title	Testing Lifecycle
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T19%3A30%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NOEL%20RUBY%20FELECIA&rft.date=2012-08-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2012198421A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true