Creating Scan Chain Definition from High-Level Model Using High-Level Model Simulation

Mechanisms are provided for creating shift register definition from high-level model using high-level model simulation. The mechanisms initialize all potential scan chain latches, identify the latches in a given scan chain, and separate the scan chain latches into chunks. For each chunk, the mechani...

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Bibliographische Detailangaben

Hauptverfasser:	MALONEY WILLIAM B, SKERGAN TIMOTHY M
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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