Semiconductor memory device and test method thereof

Semiconductor memory device and test method thereof

Example embodiments disclose a semiconductor memory device and a test method thereof. The semiconductor memory device includes a memory cell array that provides first and second data groups at a first data rate and an output circuit, in a normal mode of operation, serially outputs the first and seco...

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Hauptverfasser: LEE HYONG-YONG, JUN CHAN-SUB
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Sprache:eng
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INFORMATION STORAGE
PHYSICS
STATIC STORES
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creator LEE HYONG-YONG
JUN CHAN-SUB
description Example embodiments disclose a semiconductor memory device and a test method thereof. The semiconductor memory device includes a memory cell array that provides first and second data groups at a first data rate and an output circuit, in a normal mode of operation, serially outputs the first and second data groups at a first data rate on an external terminal. In a test mode of operation, the output circuit outputs the first data group or the second data group at a second data rate on the external terminal in response to control signals, without switching the test mode. The second data rate may be lower than the first data rate.
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The semiconductor memory device includes a memory cell array that provides first and second data groups at a first data rate and an output circuit, in a normal mode of operation, serially outputs the first and second data groups at a first data rate on an external terminal. In a test mode of operation, the output circuit outputs the first data group or the second data group at a second data rate on the external terminal in response to control signals, without switching the test mode. The second data rate may be lower than the first data rate.</abstract><oa>free_for_read</oa></addata></record>
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STATIC STORES
title Semiconductor memory device and test method thereof
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