Accelerating Automatic Test Pattern Generation in a Multi-Core Computing Environment via Speculatively Scheduled Sequential Multi-Level Parameter Value Optimization

Systems and methods provide acceleration of automatic test pattern generation in a multi-core computing environment via multi-level parameter value optimization for a parameter set with speculative scheduling. The methods described herein use multi-core based parallel runs to parallelize sequential...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KAPUR ROHIT, KUMAR ASHWIN, BALASUBRAMANIAN RAMAKRISHNAN, UPPULURI RAJESH, TIYYAGURA SUNIL REDDY, SAIKIA JYOTIRMOY, BHATTACHARYA PARTHAJIT
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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