Creating A Test Progression Plan
Automatically creating a progression plan for a software test, by computing for each test period unit x the effort for attempting to perform test units, ATTx, and the effort for completing test unit execution, CCx. Three variables characterizing the test strategy are introduced in the computation: t...
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description | Automatically creating a progression plan for a software test, by computing for each test period unit x the effort for attempting to perform test units, ATTx, and the effort for completing test unit execution, CCx. Three variables characterizing the test strategy are introduced in the computation: the Effectiveness, which represents the efficiency of the test team, the Defect Density rate, and the Verify rate value. By choosing the test strategy, the test manager defines the three variables' values which influence the progression plan. During test execution, a cumulative 'attempted' curve of the ATTx values and a cumulative 'complete' curve of the CCx values allow the test manager to compare the effort already made to the effort expected to be made for the Test Units which have been attempted and for the Test Units which have been completed, i.e. when the defects found in the code have been corrected. |
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Three variables characterizing the test strategy are introduced in the computation: the Effectiveness, which represents the efficiency of the test team, the Defect Density rate, and the Verify rate value. By choosing the test strategy, the test manager defines the three variables' values which influence the progression plan. During test execution, a cumulative 'attempted' curve of the ATTx values and a cumulative 'complete' curve of the CCx values allow the test manager to compare the effort already made to the effort expected to be made for the Test Units which have been attempted and for the Test Units which have been completed, i.e. when the defects found in the code have been corrected.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111201&DB=EPODOC&CC=US&NR=2011296371A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111201&DB=EPODOC&CC=US&NR=2011296371A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MARELLA PIETRO</creatorcontrib><title>Creating A Test Progression Plan</title><description>Automatically creating a progression plan for a software test, by computing for each test period unit x the effort for attempting to perform test units, ATTx, and the effort for completing test unit execution, CCx. Three variables characterizing the test strategy are introduced in the computation: the Effectiveness, which represents the efficiency of the test team, the Defect Density rate, and the Verify rate value. By choosing the test strategy, the test manager defines the three variables' values which influence the progression plan. During test execution, a cumulative 'attempted' curve of the ATTx values and a cumulative 'complete' curve of the CCx values allow the test manager to compare the effort already made to the effort expected to be made for the Test Units which have been attempted and for the Test Units which have been completed, i.e. when the defects found in the code have been corrected.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBwLkpNLMnMS1dwVAhJLS5RCCjKTy9KLS7OzM9TCMhJzONhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGhoZGlmbG5oaOhsbEqQIArxAlrw</recordid><startdate>20111201</startdate><enddate>20111201</enddate><creator>MARELLA PIETRO</creator><scope>EVB</scope></search><sort><creationdate>20111201</creationdate><title>Creating A Test Progression Plan</title><author>MARELLA PIETRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011296371A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>MARELLA PIETRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MARELLA PIETRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Creating A Test Progression Plan</title><date>2011-12-01</date><risdate>2011</risdate><abstract>Automatically creating a progression plan for a software test, by computing for each test period unit x the effort for attempting to perform test units, ATTx, and the effort for completing test unit execution, CCx. Three variables characterizing the test strategy are introduced in the computation: the Effectiveness, which represents the efficiency of the test team, the Defect Density rate, and the Verify rate value. By choosing the test strategy, the test manager defines the three variables' values which influence the progression plan. During test execution, a cumulative 'attempted' curve of the ATTx values and a cumulative 'complete' curve of the CCx values allow the test manager to compare the effort already made to the effort expected to be made for the Test Units which have been attempted and for the Test Units which have been completed, i.e. when the defects found in the code have been corrected.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
title | Creating A Test Progression Plan |
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