METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE
Methods of filling deep trenches in substrates are described. A method includes providing a substrate with a deep trench formed therein. The method also includes forming a dielectric layer conformal with the substrate and the deep trench. The method also includes, with the entire portion of the diel...
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creator | SIRAJUDDIN KHALID M FARR JON C PAMARTHY SHARMA V RAORANE DIGVIJAY |
description | Methods of filling deep trenches in substrates are described. A method includes providing a substrate with a deep trench formed therein. The method also includes forming a dielectric layer conformal with the substrate and the deep trench. The method also includes, with the entire portion of the dielectric layer conformal with the deep trench exposed, removing at least a portion, but not all, of the dielectric layer at the top of the deep trench with a relatively low bias plasma etch process. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011217832A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011217832A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011217832A13</originalsourceid><addsrcrecordid>eNrjZNDzdQ3x8HdR8HdTcPP08fH0c1dwVHBxdQ1QCAly9XP2UPD0AwoEhzoFhwQ5hrjyMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjA0NDI0NzC2MjR0Nj4lQBADXMJhI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE</title><source>esp@cenet</source><creator>SIRAJUDDIN KHALID M ; FARR JON C ; PAMARTHY SHARMA V ; RAORANE DIGVIJAY</creator><creatorcontrib>SIRAJUDDIN KHALID M ; FARR JON C ; PAMARTHY SHARMA V ; RAORANE DIGVIJAY</creatorcontrib><description>Methods of filling deep trenches in substrates are described. A method includes providing a substrate with a deep trench formed therein. The method also includes forming a dielectric layer conformal with the substrate and the deep trench. The method also includes, with the entire portion of the dielectric layer conformal with the deep trench exposed, removing at least a portion, but not all, of the dielectric layer at the top of the deep trench with a relatively low bias plasma etch process.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110908&DB=EPODOC&CC=US&NR=2011217832A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110908&DB=EPODOC&CC=US&NR=2011217832A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SIRAJUDDIN KHALID M</creatorcontrib><creatorcontrib>FARR JON C</creatorcontrib><creatorcontrib>PAMARTHY SHARMA V</creatorcontrib><creatorcontrib>RAORANE DIGVIJAY</creatorcontrib><title>METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE</title><description>Methods of filling deep trenches in substrates are described. A method includes providing a substrate with a deep trench formed therein. The method also includes forming a dielectric layer conformal with the substrate and the deep trench. The method also includes, with the entire portion of the dielectric layer conformal with the deep trench exposed, removing at least a portion, but not all, of the dielectric layer at the top of the deep trench with a relatively low bias plasma etch process.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDzdQ3x8HdR8HdTcPP08fH0c1dwVHBxdQ1QCAly9XP2UPD0AwoEhzoFhwQ5hrjyMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjA0NDI0NzC2MjR0Nj4lQBADXMJhI</recordid><startdate>20110908</startdate><enddate>20110908</enddate><creator>SIRAJUDDIN KHALID M</creator><creator>FARR JON C</creator><creator>PAMARTHY SHARMA V</creator><creator>RAORANE DIGVIJAY</creator><scope>EVB</scope></search><sort><creationdate>20110908</creationdate><title>METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE</title><author>SIRAJUDDIN KHALID M ; FARR JON C ; PAMARTHY SHARMA V ; RAORANE DIGVIJAY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011217832A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>SIRAJUDDIN KHALID M</creatorcontrib><creatorcontrib>FARR JON C</creatorcontrib><creatorcontrib>PAMARTHY SHARMA V</creatorcontrib><creatorcontrib>RAORANE DIGVIJAY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SIRAJUDDIN KHALID M</au><au>FARR JON C</au><au>PAMARTHY SHARMA V</au><au>RAORANE DIGVIJAY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE</title><date>2011-09-08</date><risdate>2011</risdate><abstract>Methods of filling deep trenches in substrates are described. A method includes providing a substrate with a deep trench formed therein. The method also includes forming a dielectric layer conformal with the substrate and the deep trench. The method also includes, with the entire portion of the dielectric layer conformal with the deep trench exposed, removing at least a portion, but not all, of the dielectric layer at the top of the deep trench with a relatively low bias plasma etch process.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | METHOD OF FILLING A DEEP TRENCH IN A SUBSTRATE |
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