SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are appli...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | ARIELI YOEL LANZMANN EMMANUEL WOLFLING SHAY SABAN YORAM WEITZMAN YOSI LEVAVI SHAY BANITT DAVID |
description | A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011149298A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011149298A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011149298A13</originalsourceid><addsrcrecordid>eNrjZNANDnAM8XT0UQh3DHN1C_L3C1Fw9HP0iQz2DAYyXBSMXRR8XR2DQ4NcfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoaGhiaWRpYWjoTFxqgBWpCZw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><source>esp@cenet</source><creator>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</creator><creatorcontrib>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</creatorcontrib><description>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</description><language>eng</language><subject>INFORMATION STORAGE ; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110623&DB=EPODOC&CC=US&NR=2011149298A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110623&DB=EPODOC&CC=US&NR=2011149298A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ARIELI YOEL</creatorcontrib><creatorcontrib>LANZMANN EMMANUEL</creatorcontrib><creatorcontrib>WOLFLING SHAY</creatorcontrib><creatorcontrib>SABAN YORAM</creatorcontrib><creatorcontrib>WEITZMAN YOSI</creatorcontrib><creatorcontrib>LEVAVI SHAY</creatorcontrib><creatorcontrib>BANITT DAVID</creatorcontrib><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><description>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</description><subject>INFORMATION STORAGE</subject><subject>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANDnAM8XT0UQh3DHN1C_L3C1Fw9HP0iQz2DAYyXBSMXRR8XR2DQ4NcfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoaGhiaWRpYWjoTFxqgBWpCZw</recordid><startdate>20110623</startdate><enddate>20110623</enddate><creator>ARIELI YOEL</creator><creator>LANZMANN EMMANUEL</creator><creator>WOLFLING SHAY</creator><creator>SABAN YORAM</creator><creator>WEITZMAN YOSI</creator><creator>LEVAVI SHAY</creator><creator>BANITT DAVID</creator><scope>EVB</scope></search><sort><creationdate>20110623</creationdate><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><author>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011149298A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>INFORMATION STORAGE</topic><topic>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ARIELI YOEL</creatorcontrib><creatorcontrib>LANZMANN EMMANUEL</creatorcontrib><creatorcontrib>WOLFLING SHAY</creatorcontrib><creatorcontrib>SABAN YORAM</creatorcontrib><creatorcontrib>WEITZMAN YOSI</creatorcontrib><creatorcontrib>LEVAVI SHAY</creatorcontrib><creatorcontrib>BANITT DAVID</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ARIELI YOEL</au><au>LANZMANN EMMANUEL</au><au>WOLFLING SHAY</au><au>SABAN YORAM</au><au>WEITZMAN YOSI</au><au>LEVAVI SHAY</au><au>BANITT DAVID</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><date>2011-06-23</date><risdate>2011</risdate><abstract>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2011149298A1 |
source | esp@cenet |
subjects | INFORMATION STORAGE INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
title | SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T10%3A55%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ARIELI%20YOEL&rft.date=2011-06-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2011149298A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |