SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT

A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are appli...

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Hauptverfasser: ARIELI YOEL, LANZMANN EMMANUEL, WOLFLING SHAY, SABAN YORAM, WEITZMAN YOSI, LEVAVI SHAY, BANITT DAVID
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creator ARIELI YOEL
LANZMANN EMMANUEL
WOLFLING SHAY
SABAN YORAM
WEITZMAN YOSI
LEVAVI SHAY
BANITT DAVID
description A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011149298A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011149298A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011149298A13</originalsourceid><addsrcrecordid>eNrjZNANDnAM8XT0UQh3DHN1C_L3C1Fw9HP0iQz2DAYyXBSMXRR8XR2DQ4NcfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoaGhiaWRpYWjoTFxqgBWpCZw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><source>esp@cenet</source><creator>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</creator><creatorcontrib>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</creatorcontrib><description>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</description><language>eng</language><subject>INFORMATION STORAGE ; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110623&amp;DB=EPODOC&amp;CC=US&amp;NR=2011149298A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110623&amp;DB=EPODOC&amp;CC=US&amp;NR=2011149298A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ARIELI YOEL</creatorcontrib><creatorcontrib>LANZMANN EMMANUEL</creatorcontrib><creatorcontrib>WOLFLING SHAY</creatorcontrib><creatorcontrib>SABAN YORAM</creatorcontrib><creatorcontrib>WEITZMAN YOSI</creatorcontrib><creatorcontrib>LEVAVI SHAY</creatorcontrib><creatorcontrib>BANITT DAVID</creatorcontrib><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><description>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</description><subject>INFORMATION STORAGE</subject><subject>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANDnAM8XT0UQh3DHN1C_L3C1Fw9HP0iQz2DAYyXBSMXRR8XR2DQ4NcfV39QngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBoaGhiaWRpYWjoTFxqgBWpCZw</recordid><startdate>20110623</startdate><enddate>20110623</enddate><creator>ARIELI YOEL</creator><creator>LANZMANN EMMANUEL</creator><creator>WOLFLING SHAY</creator><creator>SABAN YORAM</creator><creator>WEITZMAN YOSI</creator><creator>LEVAVI SHAY</creator><creator>BANITT DAVID</creator><scope>EVB</scope></search><sort><creationdate>20110623</creationdate><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><author>ARIELI YOEL ; LANZMANN EMMANUEL ; WOLFLING SHAY ; SABAN YORAM ; WEITZMAN YOSI ; LEVAVI SHAY ; BANITT DAVID</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011149298A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>INFORMATION STORAGE</topic><topic>INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ARIELI YOEL</creatorcontrib><creatorcontrib>LANZMANN EMMANUEL</creatorcontrib><creatorcontrib>WOLFLING SHAY</creatorcontrib><creatorcontrib>SABAN YORAM</creatorcontrib><creatorcontrib>WEITZMAN YOSI</creatorcontrib><creatorcontrib>LEVAVI SHAY</creatorcontrib><creatorcontrib>BANITT DAVID</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ARIELI YOEL</au><au>LANZMANN EMMANUEL</au><au>WOLFLING SHAY</au><au>SABAN YORAM</au><au>WEITZMAN YOSI</au><au>LEVAVI SHAY</au><au>BANITT DAVID</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT</title><date>2011-06-23</date><risdate>2011</risdate><abstract>A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.</abstract><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_US2011149298A1
source esp@cenet
subjects INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T10%3A55%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ARIELI%20YOEL&rft.date=2011-06-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2011149298A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true