METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT

METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT

A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detectio...

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Hauptverfasser: WIDZGOWSKI BERND, SCHULTE LUDGER
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Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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creator WIDZGOWSKI BERND
SCHULTE LUDGER
description A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT
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