METHOD AND DEVICE FOR DETECTING AT LEAST ONE VARIABLE AT LEAST INDIRECTLY CHARACTERIZING THE PROPERTIES OF A SURFACE IN A MATERIAL WEB TREATMENT DEVICE AND METHOD FOR OPTIMIZING THE OPERATING METHOD OF A MATERIAL WEB TREATMENT DEVICE

A method for detecting at least one value at least indirectly characterizing the properties of a surface in a material web treatment device. The method includes the steps of illuminating the surface at least at two measuring points with at least one emission source, simultaneously detecting at least...

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Bibliographische Detailangaben
1. Verfasser:	MUENCH RUDOLF
Format:	Patent
Sprache:	eng
Schlagworte:	ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METHODS OF PRODUCING PAPER THEREON PAPER-MAKING PAPER-MAKING MACHINES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PRODUCTION OF CELLULOSE TESTING TEXTILES
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Beschreibung
Zusammenfassung:	A method for detecting at least one value at least indirectly characterizing the properties of a surface in a material web treatment device. The method includes the steps of illuminating the surface at least at two measuring points with at least one emission source, simultaneously detecting at least one value at least indirectly characterizing a reflectivity of the surface at said each of the at least two measuring points with a detector device and evaluating the reflectivity.