OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE

A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the su...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WAYMAN WILLIAM H, LIU CHU-HENG, BEACHNER JAMES R
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WAYMAN WILLIAM H
LIU CHU-HENG
BEACHNER JAMES R
description A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011075131A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011075131A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011075131A13</originalsourceid><addsrcrecordid>eNrjZND1DwjxdHb0UQh29Qv2D1JwA2JnD8cgR-cQ1yDPKE8_dwVHheBQp-CQIMcQVx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgaGhgbmpobOhoaEycKgBdTiZr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><source>esp@cenet</source><creator>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</creator><creatorcontrib>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</creatorcontrib><description>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</description><language>eng</language><subject>CORRECTION OF TYPOGRAPHICAL ERRORS ; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LINING MACHINES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICS ; PRINTING ; SELECTIVE PRINTING MECHANISMS ; STAMPS ; TESTING ; TRANSPORTING ; TYPEWRITERS</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110331&amp;DB=EPODOC&amp;CC=US&amp;NR=2011075131A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110331&amp;DB=EPODOC&amp;CC=US&amp;NR=2011075131A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WAYMAN WILLIAM H</creatorcontrib><creatorcontrib>LIU CHU-HENG</creatorcontrib><creatorcontrib>BEACHNER JAMES R</creatorcontrib><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><description>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</description><subject>CORRECTION OF TYPOGRAPHICAL ERRORS</subject><subject>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LINING MACHINES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PRINTING</subject><subject>SELECTIVE PRINTING MECHANISMS</subject><subject>STAMPS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>TYPEWRITERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1DwjxdHb0UQh29Qv2D1JwA2JnD8cgR-cQ1yDPKE8_dwVHheBQp-CQIMcQVx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgaGhgbmpobOhoaEycKgBdTiZr</recordid><startdate>20110331</startdate><enddate>20110331</enddate><creator>WAYMAN WILLIAM H</creator><creator>LIU CHU-HENG</creator><creator>BEACHNER JAMES R</creator><scope>EVB</scope></search><sort><creationdate>20110331</creationdate><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><author>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011075131A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CORRECTION OF TYPOGRAPHICAL ERRORS</topic><topic>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>LINING MACHINES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PRINTING</topic><topic>SELECTIVE PRINTING MECHANISMS</topic><topic>STAMPS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>TYPEWRITERS</topic><toplevel>online_resources</toplevel><creatorcontrib>WAYMAN WILLIAM H</creatorcontrib><creatorcontrib>LIU CHU-HENG</creatorcontrib><creatorcontrib>BEACHNER JAMES R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WAYMAN WILLIAM H</au><au>LIU CHU-HENG</au><au>BEACHNER JAMES R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><date>2011-03-31</date><risdate>2011</risdate><abstract>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2011075131A1
source esp@cenet
subjects CORRECTION OF TYPOGRAPHICAL ERRORS
i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LINING MACHINES
MEASURING
PERFORMING OPERATIONS
PHYSICS
PRINTING
SELECTIVE PRINTING MECHANISMS
STAMPS
TESTING
TRANSPORTING
TYPEWRITERS
title OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T07%3A23%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WAYMAN%20WILLIAM%20H&rft.date=2011-03-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2011075131A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true