OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE
A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the su...
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creator | WAYMAN WILLIAM H LIU CHU-HENG BEACHNER JAMES R |
description | A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011075131A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011075131A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011075131A13</originalsourceid><addsrcrecordid>eNrjZND1DwjxdHb0UQh29Qv2D1JwA2JnD8cgR-cQ1yDPKE8_dwVHheBQp-CQIMcQVx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgaGhgbmpobOhoaEycKgBdTiZr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><source>esp@cenet</source><creator>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</creator><creatorcontrib>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</creatorcontrib><description>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</description><language>eng</language><subject>CORRECTION OF TYPOGRAPHICAL ERRORS ; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; LINING MACHINES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICS ; PRINTING ; SELECTIVE PRINTING MECHANISMS ; STAMPS ; TESTING ; TRANSPORTING ; TYPEWRITERS</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110331&DB=EPODOC&CC=US&NR=2011075131A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110331&DB=EPODOC&CC=US&NR=2011075131A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WAYMAN WILLIAM H</creatorcontrib><creatorcontrib>LIU CHU-HENG</creatorcontrib><creatorcontrib>BEACHNER JAMES R</creatorcontrib><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><description>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</description><subject>CORRECTION OF TYPOGRAPHICAL ERRORS</subject><subject>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>LINING MACHINES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>PRINTING</subject><subject>SELECTIVE PRINTING MECHANISMS</subject><subject>STAMPS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><subject>TYPEWRITERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND1DwjxdHb0UQh29Qv2D1JwA2JnD8cgR-cQ1yDPKE8_dwVHheBQp-CQIMcQVx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgaGhgbmpobOhoaEycKgBdTiZr</recordid><startdate>20110331</startdate><enddate>20110331</enddate><creator>WAYMAN WILLIAM H</creator><creator>LIU CHU-HENG</creator><creator>BEACHNER JAMES R</creator><scope>EVB</scope></search><sort><creationdate>20110331</creationdate><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><author>WAYMAN WILLIAM H ; LIU CHU-HENG ; BEACHNER JAMES R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011075131A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>CORRECTION OF TYPOGRAPHICAL ERRORS</topic><topic>i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>LINING MACHINES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>PRINTING</topic><topic>SELECTIVE PRINTING MECHANISMS</topic><topic>STAMPS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><topic>TYPEWRITERS</topic><toplevel>online_resources</toplevel><creatorcontrib>WAYMAN WILLIAM H</creatorcontrib><creatorcontrib>LIU CHU-HENG</creatorcontrib><creatorcontrib>BEACHNER JAMES R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WAYMAN WILLIAM H</au><au>LIU CHU-HENG</au><au>BEACHNER JAMES R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE</title><date>2011-03-31</date><risdate>2011</risdate><abstract>A substrate characterization device is provided which includes an optical sensor module and a processor. The optical sensor module includes a light emitting source and a light receiving detector for communicating with the substrate and providing an indication of the diffusion of light through the substrate. The indication of the diffusion of light through the substrate is a signal provided to a processor in communication with a memory module for making a comparison of the signal generated by the optical sensor module with a reference signal to determine the quality of the substrate.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CORRECTION OF TYPOGRAPHICAL ERRORS i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LINING MACHINES MEASURING PERFORMING OPERATIONS PHYSICS PRINTING SELECTIVE PRINTING MECHANISMS STAMPS TESTING TRANSPORTING TYPEWRITERS |
title | OPTICAL SENSOR FOR CHARACTERIZING A SUBSTRATE |
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