ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE

The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage mean...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: EGUCHI SHIRO, HIKOSAKA TOMOYUKI, SUZUKI TAKAYUKI, HARADA NOBUYASU, GOHZAKI SATORU, SATO SHIGEKATSU, HASHIMOTO ISAO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator EGUCHI SHIRO
HIKOSAKA TOMOYUKI
SUZUKI TAKAYUKI
HARADA NOBUYASU
GOHZAKI SATORU
SATO SHIGEKATSU
HASHIMOTO ISAO
description The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011062351A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011062351A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011062351A13</originalsourceid><addsrcrecordid>eNrjZLBy9XF1Dgny91NwcnX0VfAMCnJ08XQM8fRzV3AMCHAMcgwJDVYI9wzxUPD19_MM8Q8Cybi4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0MDMyNjU0NHQ2PiVAEAZPYqAQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><source>esp@cenet</source><creator>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</creator><creatorcontrib>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</creatorcontrib><description>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</description><language>eng</language><subject>GAMMA RAY OR X-RAY MICROSCOPES ; IRRADIATION DEVICES ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; PHYSICS ; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110317&amp;DB=EPODOC&amp;CC=US&amp;NR=2011062351A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110317&amp;DB=EPODOC&amp;CC=US&amp;NR=2011062351A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>EGUCHI SHIRO</creatorcontrib><creatorcontrib>HIKOSAKA TOMOYUKI</creatorcontrib><creatorcontrib>SUZUKI TAKAYUKI</creatorcontrib><creatorcontrib>HARADA NOBUYASU</creatorcontrib><creatorcontrib>GOHZAKI SATORU</creatorcontrib><creatorcontrib>SATO SHIGEKATSU</creatorcontrib><creatorcontrib>HASHIMOTO ISAO</creatorcontrib><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><description>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</description><subject>GAMMA RAY OR X-RAY MICROSCOPES</subject><subject>IRRADIATION DEVICES</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBy9XF1Dgny91NwcnX0VfAMCnJ08XQM8fRzV3AMCHAMcgwJDVYI9wzxUPD19_MM8Q8Cybi4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0MDMyNjU0NHQ2PiVAEAZPYqAQ</recordid><startdate>20110317</startdate><enddate>20110317</enddate><creator>EGUCHI SHIRO</creator><creator>HIKOSAKA TOMOYUKI</creator><creator>SUZUKI TAKAYUKI</creator><creator>HARADA NOBUYASU</creator><creator>GOHZAKI SATORU</creator><creator>SATO SHIGEKATSU</creator><creator>HASHIMOTO ISAO</creator><scope>EVB</scope></search><sort><creationdate>20110317</creationdate><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><author>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011062351A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>GAMMA RAY OR X-RAY MICROSCOPES</topic><topic>IRRADIATION DEVICES</topic><topic>NUCLEAR ENGINEERING</topic><topic>NUCLEAR PHYSICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>EGUCHI SHIRO</creatorcontrib><creatorcontrib>HIKOSAKA TOMOYUKI</creatorcontrib><creatorcontrib>SUZUKI TAKAYUKI</creatorcontrib><creatorcontrib>HARADA NOBUYASU</creatorcontrib><creatorcontrib>GOHZAKI SATORU</creatorcontrib><creatorcontrib>SATO SHIGEKATSU</creatorcontrib><creatorcontrib>HASHIMOTO ISAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>EGUCHI SHIRO</au><au>HIKOSAKA TOMOYUKI</au><au>SUZUKI TAKAYUKI</au><au>HARADA NOBUYASU</au><au>GOHZAKI SATORU</au><au>SATO SHIGEKATSU</au><au>HASHIMOTO ISAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><date>2011-03-17</date><risdate>2011</risdate><abstract>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2011062351A1
source esp@cenet
subjects GAMMA RAY OR X-RAY MICROSCOPES
IRRADIATION DEVICES
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
PHYSICS
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
title ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T22%3A29%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=EGUCHI%20SHIRO&rft.date=2011-03-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2011062351A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true