ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE
The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage mean...
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creator | EGUCHI SHIRO HIKOSAKA TOMOYUKI SUZUKI TAKAYUKI HARADA NOBUYASU GOHZAKI SATORU SATO SHIGEKATSU HASHIMOTO ISAO |
description | The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2011062351A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2011062351A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2011062351A13</originalsourceid><addsrcrecordid>eNrjZLBy9XF1Dgny91NwcnX0VfAMCnJ08XQM8fRzV3AMCHAMcgwJDVYI9wzxUPD19_MM8Q8Cybi4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0MDMyNjU0NHQ2PiVAEAZPYqAQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><source>esp@cenet</source><creator>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</creator><creatorcontrib>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</creatorcontrib><description>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</description><language>eng</language><subject>GAMMA RAY OR X-RAY MICROSCOPES ; IRRADIATION DEVICES ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; PHYSICS ; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110317&DB=EPODOC&CC=US&NR=2011062351A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110317&DB=EPODOC&CC=US&NR=2011062351A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>EGUCHI SHIRO</creatorcontrib><creatorcontrib>HIKOSAKA TOMOYUKI</creatorcontrib><creatorcontrib>SUZUKI TAKAYUKI</creatorcontrib><creatorcontrib>HARADA NOBUYASU</creatorcontrib><creatorcontrib>GOHZAKI SATORU</creatorcontrib><creatorcontrib>SATO SHIGEKATSU</creatorcontrib><creatorcontrib>HASHIMOTO ISAO</creatorcontrib><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><description>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</description><subject>GAMMA RAY OR X-RAY MICROSCOPES</subject><subject>IRRADIATION DEVICES</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBy9XF1Dgny91NwcnX0VfAMCnJ08XQM8fRzV3AMCHAMcgwJDVYI9wzxUPD19_MM8Q8Cybi4hnk6u_IwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDQ0MDMyNjU0NHQ2PiVAEAZPYqAQ</recordid><startdate>20110317</startdate><enddate>20110317</enddate><creator>EGUCHI SHIRO</creator><creator>HIKOSAKA TOMOYUKI</creator><creator>SUZUKI TAKAYUKI</creator><creator>HARADA NOBUYASU</creator><creator>GOHZAKI SATORU</creator><creator>SATO SHIGEKATSU</creator><creator>HASHIMOTO ISAO</creator><scope>EVB</scope></search><sort><creationdate>20110317</creationdate><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><author>EGUCHI SHIRO ; HIKOSAKA TOMOYUKI ; SUZUKI TAKAYUKI ; HARADA NOBUYASU ; GOHZAKI SATORU ; SATO SHIGEKATSU ; HASHIMOTO ISAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2011062351A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>GAMMA RAY OR X-RAY MICROSCOPES</topic><topic>IRRADIATION DEVICES</topic><topic>NUCLEAR ENGINEERING</topic><topic>NUCLEAR PHYSICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>EGUCHI SHIRO</creatorcontrib><creatorcontrib>HIKOSAKA TOMOYUKI</creatorcontrib><creatorcontrib>SUZUKI TAKAYUKI</creatorcontrib><creatorcontrib>HARADA NOBUYASU</creatorcontrib><creatorcontrib>GOHZAKI SATORU</creatorcontrib><creatorcontrib>SATO SHIGEKATSU</creatorcontrib><creatorcontrib>HASHIMOTO ISAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>EGUCHI SHIRO</au><au>HIKOSAKA TOMOYUKI</au><au>SUZUKI TAKAYUKI</au><au>HARADA NOBUYASU</au><au>GOHZAKI SATORU</au><au>SATO SHIGEKATSU</au><au>HASHIMOTO ISAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE</title><date>2011-03-17</date><risdate>2011</risdate><abstract>The electron beam irradiating apparatus with the monitoring device has an electron beam irradiating means for irradiating materials in an irradiation chamber. The monitoring device has a photographing means for imaging a lights emitted by irradiating an electron beam to the materials; a storage means that stores state of electron beam irradiation in advance; and a calculating means that processes an image, which is captured by the photographing means, to decide a state of electron beam irradiation. The storage means has stored at least three state of electron beam irradiation and also has stored image luminance associated with those states of electron beam irradiation. The calculating means loads the image, which is captured by the photographing means, to compare the loaded image with the image luminance stored in the storage means, thereby deciding a state of electron beam irradiation.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | GAMMA RAY OR X-RAY MICROSCOPES IRRADIATION DEVICES NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR |
title | ELECTRON BEAM IRRADIATING APPARATUS WITH MONITORING DEVICE |
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