MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS

A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a t...

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Hauptverfasser:	SCHWOERER GERALD A, GROSSMEIER ALAN M, RESNICK DAVID R, MARQUARDT KELLY J, STEINBERGER MICHAEL L, BETHARD ROGER A, SNYDER VAN L
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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creator	SCHWOERER GERALD A GROSSMEIER ALAN M RESNICK DAVID R MARQUARDT KELLY J STEINBERGER MICHAEL L BETHARD ROGER A SNYDER VAN L
description	A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a test controller on a test fixture that allows simultaneous testing of a single MDC or one or more pairs of MDCs, one MDC in a pair (e.g., the "golden" MDC) testing the other MDC of that pair. Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.
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Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101223&DB=EPODOC&CC=US&NR=2010324854A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101223&DB=EPODOC&CC=US&NR=2010324854A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHWOERER GERALD A</creatorcontrib><creatorcontrib>GROSSMEIER ALAN M</creatorcontrib><creatorcontrib>RESNICK DAVID R</creatorcontrib><creatorcontrib>MARQUARDT KELLY J</creatorcontrib><creatorcontrib>STEINBERGER MICHAEL L</creatorcontrib><creatorcontrib>BETHARD ROGER A</creatorcontrib><creatorcontrib>SNYDER VAN L</creatorcontrib><title>MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS</title><description>A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. 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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
title	MEMORY-DAUGHTER-CARD-TESTING METHOD AND APPARATUS
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