METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONTROL SYSTEM

Example methods and apparatus to predict process quality in a process control system are disclosed. A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value ass...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NIXON MARK, REISS RANDOLF, WOJSZNIS WILHELM K, WOREK CHRISTOPHER, BLEVINS TERRENCE LYNN, MUSTON PAUL RICHARD
Format:	Patent
Sprache:	eng
Schlagworte:	ANALOGUE COMPUTERS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
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