METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONTROL SYSTEM
Example methods and apparatus to predict process quality in a process control system are disclosed. A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value ass...
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| creator | NIXON MARK REISS RANDOLF WOJSZNIS WILHELM K WOREK CHRISTOPHER BLEVINS TERRENCE LYNN MUSTON PAUL RICHARD |
| description | Example methods and apparatus to predict process quality in a process control system are disclosed. A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value associated with a second measured variable, determining if a variation based on the received process control information associated with the process exceeds a threshold, if the variation exceeds the threshold, calculating a first contribution value based on a contribution of the first measured variable to the variation and a second contribution value based on a contribution of the second measured variable to the variation, determining at least one corrective action based on the first contribution value, the second contribution value, the first value, or the second value, and calculating a predicted process quality based on the at least one corrective action at a time after the first time. |
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A disclosed example method includes receiving process control information relating to a process at a first time including a first value associated with a first measured variable and a second value associated with a second measured variable, determining if a variation based on the received process control information associated with the process exceeds a threshold, if the variation exceeds the threshold, calculating a first contribution value based on a contribution of the first measured variable to the variation and a second contribution value based on a contribution of the second measured variable to the variation, determining at least one corrective action based on the first contribution value, the second contribution value, the first value, or the second value, and calculating a predicted process quality based on the at least one corrective action at a time after the first time.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ANALOGUE COMPUTERS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | METHODS AND APPARATUS TO PREDICT PROCESS QUALITY IN A PROCESS CONTROL SYSTEM |
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