CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE
A computer program product and system for configuring J electromagnetic radiation sources (J 2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I 2) thereon. P...
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| creator | NOWAK EDWARD JOSEPH ANDERSON BRENT ALAN |
| description | A computer program product and system for configuring J electromagnetic radiation sources (J 2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I 2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J). |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2010318210A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2010318210A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2010318210A13</originalsourceid><addsrcrecordid>eNrjZHB19vdz83QPDfL0c1cIcnTxdAzx9PdTCPYPDXJ2DVYI8VcI9vQN9Qlx9HP1Dw32iVTwDIKoclVwVAgOdQoOCQKyeRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGhgbGhhZGhgaOhMXGqAHS_LWI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE</title><source>esp@cenet</source><creator>NOWAK EDWARD JOSEPH ; ANDERSON BRENT ALAN</creator><creatorcontrib>NOWAK EDWARD JOSEPH ; ANDERSON BRENT ALAN</creatorcontrib><description>A computer program product and system for configuring J electromagnetic radiation sources (J 2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I 2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J).</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101216&DB=EPODOC&CC=US&NR=2010318210A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20101216&DB=EPODOC&CC=US&NR=2010318210A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOWAK EDWARD JOSEPH</creatorcontrib><creatorcontrib>ANDERSON BRENT ALAN</creatorcontrib><title>CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE</title><description>A computer program product and system for configuring J electromagnetic radiation sources (J 2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I 2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J).</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB19vdz83QPDfL0c1cIcnTxdAzx9PdTCPYPDXJ2DVYI8VcI9vQN9Qlx9HP1Dw32iVTwDIKoclVwVAgOdQoOCQKyeRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGhgbGhhZGhgaOhMXGqAHS_LWI</recordid><startdate>20101216</startdate><enddate>20101216</enddate><creator>NOWAK EDWARD JOSEPH</creator><creator>ANDERSON BRENT ALAN</creator><scope>EVB</scope></search><sort><creationdate>20101216</creationdate><title>CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE</title><author>NOWAK EDWARD JOSEPH ; ANDERSON BRENT ALAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2010318210A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>NOWAK EDWARD JOSEPH</creatorcontrib><creatorcontrib>ANDERSON BRENT ALAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOWAK EDWARD JOSEPH</au><au>ANDERSON BRENT ALAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE</title><date>2010-12-16</date><risdate>2010</risdate><abstract>A computer program product and system for configuring J electromagnetic radiation sources (J 2) to simultaneously irradiate a substrate. Each source has a different function of wavelength and angular distribution of emitted radiation. The substrate includes a base layer and I stacks (I 2) thereon. Pj denotes a same source-specific normally incident energy flux on each stack from source j. For simultaneous exposure of the I stacks to radiation from the J sources, Pj is computed such that an error E being a function of |W1−S1|, |W2−S2|, |WI−SI| is about minimized with respect to Pj (j=1, . . . , J). Wi and Si respectively denote an actual and target energy flux transmitted into the substrate via stack i (i=1, . . . , I). The stacks are exposed to the radiation from the sources characterized by the computed Pj (j=1, . . . , J).</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | CONFIGURING RADIATION SOURCES TO SIMULTANEOUSLY IRRADIATE A SUBSTRATE |
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