FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT
A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | NISHIOKA ATSUSHI KASAHARA TAKENORI OOTANI TATSUYUKI KIYOFUJI YASUHIRO KUBOTA MANABU FURUTA YASUYUKI YOSHIDA KATSUMI NAGAYAMA SYUICHI TANAKA HIDECHIYO TERAE HISASHI KAWAWA FUJIYA ISHIKAWA MASAKAZU |
description | A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2010235699A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2010235699A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2010235699A13</originalsourceid><addsrcrecordid>eNqNirsKwjAUQLM4iPoPF5yLfWCh4yWPJpAmob2ZS5E4iRbq_2MGJyenc-CcPVsURksgDPbOT2YCDAFHpJjNCfitgyTtBXgFQw6m4Bqdkza_aH0PxoVIFx8pA7gZeTR0ZLv78tjS6csDOytJXBdpfc1pW5dbeqb3HKe6rMq6ubZdh1Xz3_UBleA04A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT</title><source>esp@cenet</source><creator>NISHIOKA ATSUSHI ; KASAHARA TAKENORI ; OOTANI TATSUYUKI ; KIYOFUJI YASUHIRO ; KUBOTA MANABU ; FURUTA YASUYUKI ; YOSHIDA KATSUMI ; NAGAYAMA SYUICHI ; TANAKA HIDECHIYO ; TERAE HISASHI ; KAWAWA FUJIYA ; ISHIKAWA MASAKAZU</creator><creatorcontrib>NISHIOKA ATSUSHI ; KASAHARA TAKENORI ; OOTANI TATSUYUKI ; KIYOFUJI YASUHIRO ; KUBOTA MANABU ; FURUTA YASUYUKI ; YOSHIDA KATSUMI ; NAGAYAMA SYUICHI ; TANAKA HIDECHIYO ; TERAE HISASHI ; KAWAWA FUJIYA ; ISHIKAWA MASAKAZU</creatorcontrib><description>A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100916&DB=EPODOC&CC=US&NR=2010235699A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20100916&DB=EPODOC&CC=US&NR=2010235699A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHIOKA ATSUSHI</creatorcontrib><creatorcontrib>KASAHARA TAKENORI</creatorcontrib><creatorcontrib>OOTANI TATSUYUKI</creatorcontrib><creatorcontrib>KIYOFUJI YASUHIRO</creatorcontrib><creatorcontrib>KUBOTA MANABU</creatorcontrib><creatorcontrib>FURUTA YASUYUKI</creatorcontrib><creatorcontrib>YOSHIDA KATSUMI</creatorcontrib><creatorcontrib>NAGAYAMA SYUICHI</creatorcontrib><creatorcontrib>TANAKA HIDECHIYO</creatorcontrib><creatorcontrib>TERAE HISASHI</creatorcontrib><creatorcontrib>KAWAWA FUJIYA</creatorcontrib><creatorcontrib>ISHIKAWA MASAKAZU</creatorcontrib><title>FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT</title><description>A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirsKwjAUQLM4iPoPF5yLfWCh4yWPJpAmob2ZS5E4iRbq_2MGJyenc-CcPVsURksgDPbOT2YCDAFHpJjNCfitgyTtBXgFQw6m4Bqdkza_aH0PxoVIFx8pA7gZeTR0ZLv78tjS6csDOytJXBdpfc1pW5dbeqb3HKe6rMq6ubZdh1Xz3_UBleA04A</recordid><startdate>20100916</startdate><enddate>20100916</enddate><creator>NISHIOKA ATSUSHI</creator><creator>KASAHARA TAKENORI</creator><creator>OOTANI TATSUYUKI</creator><creator>KIYOFUJI YASUHIRO</creator><creator>KUBOTA MANABU</creator><creator>FURUTA YASUYUKI</creator><creator>YOSHIDA KATSUMI</creator><creator>NAGAYAMA SYUICHI</creator><creator>TANAKA HIDECHIYO</creator><creator>TERAE HISASHI</creator><creator>KAWAWA FUJIYA</creator><creator>ISHIKAWA MASAKAZU</creator><scope>EVB</scope></search><sort><creationdate>20100916</creationdate><title>FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT</title><author>NISHIOKA ATSUSHI ; KASAHARA TAKENORI ; OOTANI TATSUYUKI ; KIYOFUJI YASUHIRO ; KUBOTA MANABU ; FURUTA YASUYUKI ; YOSHIDA KATSUMI ; NAGAYAMA SYUICHI ; TANAKA HIDECHIYO ; TERAE HISASHI ; KAWAWA FUJIYA ; ISHIKAWA MASAKAZU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2010235699A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHIOKA ATSUSHI</creatorcontrib><creatorcontrib>KASAHARA TAKENORI</creatorcontrib><creatorcontrib>OOTANI TATSUYUKI</creatorcontrib><creatorcontrib>KIYOFUJI YASUHIRO</creatorcontrib><creatorcontrib>KUBOTA MANABU</creatorcontrib><creatorcontrib>FURUTA YASUYUKI</creatorcontrib><creatorcontrib>YOSHIDA KATSUMI</creatorcontrib><creatorcontrib>NAGAYAMA SYUICHI</creatorcontrib><creatorcontrib>TANAKA HIDECHIYO</creatorcontrib><creatorcontrib>TERAE HISASHI</creatorcontrib><creatorcontrib>KAWAWA FUJIYA</creatorcontrib><creatorcontrib>ISHIKAWA MASAKAZU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHIOKA ATSUSHI</au><au>KASAHARA TAKENORI</au><au>OOTANI TATSUYUKI</au><au>KIYOFUJI YASUHIRO</au><au>KUBOTA MANABU</au><au>FURUTA YASUYUKI</au><au>YOSHIDA KATSUMI</au><au>NAGAYAMA SYUICHI</au><au>TANAKA HIDECHIYO</au><au>TERAE HISASHI</au><au>KAWAWA FUJIYA</au><au>ISHIKAWA MASAKAZU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT</title><date>2010-09-16</date><risdate>2010</risdate><abstract>A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2010235699A1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING |
title | FAULT DIAGNOSIS APPARATUS AND FAULT DIAGNOSIS METHOD OF MULTI-CHANNEL ANALOG INPUT/OUTPUT CIRCUIT |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T04%3A09%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NISHIOKA%20ATSUSHI&rft.date=2010-09-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2010235699A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |