Semiconductor Die Separation Method

According to the invention, die shift is reduced or substantially eliminated, by cutting the wafer in two stages. In some embodiments a first wafer cutting procedure is carried out prior to thinning the wafer to the prescribed die thickness; and in other embodiments the wafer is thinned to the presc...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PAN WEIPING, VILLAVICENCIO GRANT, MELCHER DEANN EILEEN, CO REYNALDO
Format: Patent
Sprache:eng
Schlagworte:
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