MANUFACTURING INSTRUCTION EVALUATION SUPPORT SYSTEM, MANUFACTURING INSTRUCTION EVALUATION SUPPORT METHOD, AND MANUFACTURING INSTRUCTION EVALUATION SUPPORT PROGRAM
A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter config...
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| creator | NAKAMURA ISAO YAMAMOTO YUKIKO UMEKI HARUO TADOKORO AKIKO HOTEHAMA ATSUNORI HANAWA SHINICHIROU HAMAMOTO YOUICHI KONDO AKIHIRO HIRAOKA KOUICHI |
| description | A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference value as optimum parameters, and a regression equation calculating part that calculates and displays a regression equation when employing the optimum parameters with the multiple regression analysis program. |
| format | Patent |
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TECHNOLOGICAL DEVELOPMENTS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><topic>TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKAMURA ISAO</creatorcontrib><creatorcontrib>YAMAMOTO YUKIKO</creatorcontrib><creatorcontrib>UMEKI HARUO</creatorcontrib><creatorcontrib>TADOKORO AKIKO</creatorcontrib><creatorcontrib>HOTEHAMA ATSUNORI</creatorcontrib><creatorcontrib>HANAWA SHINICHIROU</creatorcontrib><creatorcontrib>HAMAMOTO YOUICHI</creatorcontrib><creatorcontrib>KONDO AKIHIRO</creatorcontrib><creatorcontrib>HIRAOKA KOUICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKAMURA ISAO</au><au>YAMAMOTO YUKIKO</au><au>UMEKI HARUO</au><au>TADOKORO AKIKO</au><au>HOTEHAMA ATSUNORI</au><au>HANAWA SHINICHIROU</au><au>HAMAMOTO YOUICHI</au><au>KONDO AKIHIRO</au><au>HIRAOKA KOUICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MANUFACTURING INSTRUCTION EVALUATION SUPPORT SYSTEM, MANUFACTURING INSTRUCTION EVALUATION SUPPORT METHOD, AND MANUFACTURING INSTRUCTION EVALUATION SUPPORT PROGRAM</title><date>2009-11-26</date><risdate>2009</risdate><abstract>A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference value as optimum parameters, and a regression equation calculating part that calculates and displays a regression equation when employing the optimum parameters with the multiple regression analysis program.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE |
| title | MANUFACTURING INSTRUCTION EVALUATION SUPPORT SYSTEM, MANUFACTURING INSTRUCTION EVALUATION SUPPORT METHOD, AND MANUFACTURING INSTRUCTION EVALUATION SUPPORT PROGRAM |
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