SYSTEMS FOR INSPECTION OF SHROUDS

A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element.

Bibliographische Detailangaben

Hauptverfasser:	ANDARAWIS EMAD ANDARAWIS, UMEH CHUKWUELOKA OBIORA
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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