BUILT IN SELF TEST FOR INPUT/OUTPUT CHARACTERIZATION

A test system in an integrated circuit includes at least one boundary scan cell. The boundary scan cell includes a first storage element and a second storage element connected in series with the first storage element. The boundary scan cell also includes test logic configured to provide a test compl...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TORBEY ELIE, JAYARAM VINAY B, SEIBOLD JOHN JOSEPH
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!