Methods for compensating parameters of operating accelerometer for temperature variations

A method is disclosed in this invention for compensating a temperature dependent variation of an offset Voffset and sensitivity Vsensitivity parameters of an accelerometer. The method includes steps of a) Measuring a Sensitivity Vsensitivity(T0) and an Offset Voffset(T0) at a room temperature T0 to...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: LOU RUEY-DER
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LOU RUEY-DER
description A method is disclosed in this invention for compensating a temperature dependent variation of an offset Voffset and sensitivity Vsensitivity parameters of an accelerometer. The method includes steps of a) Measuring a Sensitivity Vsensitivity(T0) and an Offset Voffset(T0) at a room temperature T0 to input to a microprocessor to calculate two tilt angles theta1 and theta2 in placing the accelerometer in a furnace for adjusting a controllable temperature therein; b) Keeping the accelerometer at the fixed tilt angle theta1 and adjusting the temperature of the furnace for measuring an output voltage at theta1 Vo(T, theta1) and keeping the accelerometer at another fixed tilt angle theta2 and adjusting the temperature of the furnace for measuring an output voltage at theta2 Vo(T, theta2); and c) solving equations to obtain the offset Voffset and sensitivity Vsensitivity parameters at different temperatures and storing these parameters in the microprocessor.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2009090183A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2009090183A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2009090183A13</originalsourceid><addsrcrecordid>eNqNi7EKAjEQRNNYiPoPAWvhzmu0FFFsrNTC6lji5Dy4ZMNu9Ps9oh8gUwzMezM19zPykx9qPYt1HBKiUu5jZxMJBWSIWvaWE-S7k3MYIFxYuWWEQl8C-ybpR4-jzs3E06BY_HpmlsfDdX9aIXELTeQQkdvbZV1V2zH1ptnVzX_WB2k8PNk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods for compensating parameters of operating accelerometer for temperature variations</title><source>esp@cenet</source><creator>LOU RUEY-DER</creator><creatorcontrib>LOU RUEY-DER</creatorcontrib><description>A method is disclosed in this invention for compensating a temperature dependent variation of an offset Voffset and sensitivity Vsensitivity parameters of an accelerometer. The method includes steps of a) Measuring a Sensitivity Vsensitivity(T0) and an Offset Voffset(T0) at a room temperature T0 to input to a microprocessor to calculate two tilt angles theta1 and theta2 in placing the accelerometer in a furnace for adjusting a controllable temperature therein; b) Keeping the accelerometer at the fixed tilt angle theta1 and adjusting the temperature of the furnace for measuring an output voltage at theta1 Vo(T, theta1) and keeping the accelerometer at another fixed tilt angle theta2 and adjusting the temperature of the furnace for measuring an output voltage at theta2 Vo(T, theta2); and c) solving equations to obtain the offset Voffset and sensitivity Vsensitivity parameters at different temperatures and storing these parameters in the microprocessor.</description><language>eng</language><subject>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT ; MEASURING ; MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK ; PHYSICS ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090409&amp;DB=EPODOC&amp;CC=US&amp;NR=2009090183A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090409&amp;DB=EPODOC&amp;CC=US&amp;NR=2009090183A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LOU RUEY-DER</creatorcontrib><title>Methods for compensating parameters of operating accelerometer for temperature variations</title><description>A method is disclosed in this invention for compensating a temperature dependent variation of an offset Voffset and sensitivity Vsensitivity parameters of an accelerometer. The method includes steps of a) Measuring a Sensitivity Vsensitivity(T0) and an Offset Voffset(T0) at a room temperature T0 to input to a microprocessor to calculate two tilt angles theta1 and theta2 in placing the accelerometer in a furnace for adjusting a controllable temperature therein; b) Keeping the accelerometer at the fixed tilt angle theta1 and adjusting the temperature of the furnace for measuring an output voltage at theta1 Vo(T, theta1) and keeping the accelerometer at another fixed tilt angle theta2 and adjusting the temperature of the furnace for measuring an output voltage at theta2 Vo(T, theta2); and c) solving equations to obtain the offset Voffset and sensitivity Vsensitivity parameters at different temperatures and storing these parameters in the microprocessor.</description><subject>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</subject><subject>MEASURING</subject><subject>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNi7EKAjEQRNNYiPoPAWvhzmu0FFFsrNTC6lji5Dy4ZMNu9Ps9oh8gUwzMezM19zPykx9qPYt1HBKiUu5jZxMJBWSIWvaWE-S7k3MYIFxYuWWEQl8C-ybpR4-jzs3E06BY_HpmlsfDdX9aIXELTeQQkdvbZV1V2zH1ptnVzX_WB2k8PNk</recordid><startdate>20090409</startdate><enddate>20090409</enddate><creator>LOU RUEY-DER</creator><scope>EVB</scope></search><sort><creationdate>20090409</creationdate><title>Methods for compensating parameters of operating accelerometer for temperature variations</title><author>LOU RUEY-DER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2009090183A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT</topic><topic>MEASURING</topic><topic>MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LOU RUEY-DER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LOU RUEY-DER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods for compensating parameters of operating accelerometer for temperature variations</title><date>2009-04-09</date><risdate>2009</risdate><abstract>A method is disclosed in this invention for compensating a temperature dependent variation of an offset Voffset and sensitivity Vsensitivity parameters of an accelerometer. The method includes steps of a) Measuring a Sensitivity Vsensitivity(T0) and an Offset Voffset(T0) at a room temperature T0 to input to a microprocessor to calculate two tilt angles theta1 and theta2 in placing the accelerometer in a furnace for adjusting a controllable temperature therein; b) Keeping the accelerometer at the fixed tilt angle theta1 and adjusting the temperature of the furnace for measuring an output voltage at theta1 Vo(T, theta1) and keeping the accelerometer at another fixed tilt angle theta2 and adjusting the temperature of the furnace for measuring an output voltage at theta2 Vo(T, theta2); and c) solving equations to obtain the offset Voffset and sensitivity Vsensitivity parameters at different temperatures and storing these parameters in the microprocessor.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2009090183A1
source esp@cenet
subjects INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
MEASURING
MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK
PHYSICS
TESTING
title Methods for compensating parameters of operating accelerometer for temperature variations
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T03%3A39%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LOU%20RUEY-DER&rft.date=2009-04-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2009090183A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true