APPARATUS, SYSTEM, AND METHOD FOR INTEGRATED COMPONENT TESTING

APPARATUS, SYSTEM, AND METHOD FOR INTEGRATED COMPONENT TESTING

An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference...

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Hauptverfasser: MATOGLU ERDEM, PHAM NAM HUU, CASES MOISES, DASARI SHIVA R, MUTNURY BHYRAV MURTHY
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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creator MATOGLU ERDEM
PHAM NAM HUU
CASES MOISES
DASARI SHIVA R
MUTNURY BHYRAV MURTHY
description An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
title APPARATUS, SYSTEM, AND METHOD FOR INTEGRATED COMPONENT TESTING
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