ESD PROTECTION CIRCUIT AND METHOD
A system includes a driving device operating at first supply voltage Vdd1 and having a CMOS output. A driven device operates at a second supply voltage Vdd2 lower than the first supply voltage Vdd1, and has a CMOS input with an NMOS pull-down transistor. A protection circuit includes a first resisto...
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creator | LIN SHU-HUEI WU YI-HSUN LIN YUANG GAN CHONG-GIM |
description | A system includes a driving device operating at first supply voltage Vdd1 and having a CMOS output. A driven device operates at a second supply voltage Vdd2 lower than the first supply voltage Vdd1, and has a CMOS input with an NMOS pull-down transistor. A protection circuit includes a first resistor coupled to the CMOS output of the driving device and a gate of the NMOS pull-down transistor. A parasitic NPN bipolar junction transistor has a drain connected to the gate of the NMOS pull-down transistor and a source coupled to a lower-voltage supply rail VSS. A second resistor connects a gate of the parasitic NPN bipolar junction transistor to Vss. The second resistor has a resistance sized for controlling a trigger voltage of the parasitic NPN bipolar junction transistor for protecting a gate oxide layer of the NMOS pull-down transistor from an electrostatic discharge. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2009067105A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2009067105A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2009067105A13</originalsourceid><addsrcrecordid>eNrjZFB0DXZRCAjyD3F1DvH091Nw9gxyDvUMUXD0c1HwdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBgaWBmbmhgamjobGxKkCAJdgIwI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ESD PROTECTION CIRCUIT AND METHOD</title><source>esp@cenet</source><creator>LIN SHU-HUEI ; WU YI-HSUN ; LIN YUANG ; GAN CHONG-GIM</creator><creatorcontrib>LIN SHU-HUEI ; WU YI-HSUN ; LIN YUANG ; GAN CHONG-GIM</creatorcontrib><description>A system includes a driving device operating at first supply voltage Vdd1 and having a CMOS output. A driven device operates at a second supply voltage Vdd2 lower than the first supply voltage Vdd1, and has a CMOS input with an NMOS pull-down transistor. A protection circuit includes a first resistor coupled to the CMOS output of the driving device and a gate of the NMOS pull-down transistor. A parasitic NPN bipolar junction transistor has a drain connected to the gate of the NMOS pull-down transistor and a source coupled to a lower-voltage supply rail VSS. A second resistor connects a gate of the parasitic NPN bipolar junction transistor to Vss. The second resistor has a resistance sized for controlling a trigger voltage of the parasitic NPN bipolar junction transistor for protecting a gate oxide layer of the NMOS pull-down transistor from an electrostatic discharge.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS ; GENERATION ; SEMICONDUCTOR DEVICES</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090312&DB=EPODOC&CC=US&NR=2009067105A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090312&DB=EPODOC&CC=US&NR=2009067105A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIN SHU-HUEI</creatorcontrib><creatorcontrib>WU YI-HSUN</creatorcontrib><creatorcontrib>LIN YUANG</creatorcontrib><creatorcontrib>GAN CHONG-GIM</creatorcontrib><title>ESD PROTECTION CIRCUIT AND METHOD</title><description>A system includes a driving device operating at first supply voltage Vdd1 and having a CMOS output. A driven device operates at a second supply voltage Vdd2 lower than the first supply voltage Vdd1, and has a CMOS input with an NMOS pull-down transistor. A protection circuit includes a first resistor coupled to the CMOS output of the driving device and a gate of the NMOS pull-down transistor. A parasitic NPN bipolar junction transistor has a drain connected to the gate of the NMOS pull-down transistor and a source coupled to a lower-voltage supply rail VSS. A second resistor connects a gate of the parasitic NPN bipolar junction transistor to Vss. The second resistor has a resistance sized for controlling a trigger voltage of the parasitic NPN bipolar junction transistor for protecting a gate oxide layer of the NMOS pull-down transistor from an electrostatic discharge.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS</subject><subject>GENERATION</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB0DXZRCAjyD3F1DvH091Nw9gxyDvUMUXD0c1HwdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBgaWBmbmhgamjobGxKkCAJdgIwI</recordid><startdate>20090312</startdate><enddate>20090312</enddate><creator>LIN SHU-HUEI</creator><creator>WU YI-HSUN</creator><creator>LIN YUANG</creator><creator>GAN CHONG-GIM</creator><scope>EVB</scope></search><sort><creationdate>20090312</creationdate><title>ESD PROTECTION CIRCUIT AND METHOD</title><author>LIN SHU-HUEI ; WU YI-HSUN ; LIN YUANG ; GAN CHONG-GIM</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2009067105A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS</topic><topic>GENERATION</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>LIN SHU-HUEI</creatorcontrib><creatorcontrib>WU YI-HSUN</creatorcontrib><creatorcontrib>LIN YUANG</creatorcontrib><creatorcontrib>GAN CHONG-GIM</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIN SHU-HUEI</au><au>WU YI-HSUN</au><au>LIN YUANG</au><au>GAN CHONG-GIM</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ESD PROTECTION CIRCUIT AND METHOD</title><date>2009-03-12</date><risdate>2009</risdate><abstract>A system includes a driving device operating at first supply voltage Vdd1 and having a CMOS output. A driven device operates at a second supply voltage Vdd2 lower than the first supply voltage Vdd1, and has a CMOS input with an NMOS pull-down transistor. A protection circuit includes a first resistor coupled to the CMOS output of the driving device and a gate of the NMOS pull-down transistor. A parasitic NPN bipolar junction transistor has a drain connected to the gate of the NMOS pull-down transistor and a source coupled to a lower-voltage supply rail VSS. A second resistor connects a gate of the parasitic NPN bipolar junction transistor to Vss. The second resistor has a resistance sized for controlling a trigger voltage of the parasitic NPN bipolar junction transistor for protecting a gate oxide layer of the NMOS pull-down transistor from an electrostatic discharge.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS GENERATION SEMICONDUCTOR DEVICES |
title | ESD PROTECTION CIRCUIT AND METHOD |
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