Input/output multiplexer bus

Input/output multiplexer bus

An input/output ("I/O") system includes a plurality of input/output ("I/O") ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more electrical properties of one or more devices to be externally coupled to one or more o...

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1. Verfasser: SEQUINE DENNIS R
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SEQUINE DENNIS R
description An input/output ("I/O") system includes a plurality of input/output ("I/O") ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more electrical properties of one or more devices to be externally coupled to one or more of the I/O ports. The I/O multiplexer bus is coupled between the I/O ports and the measurement circuitry. The I/O multiplexer bus is programmable to selectively couple the measurement circuitry to any of the I/O ports.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008312857A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008312857A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008312857A13</originalsourceid><addsrcrecordid>eNrjZJDxzCsoLdHPLy0BUgq5pTklmQU5qRWpRQpJpcU8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-NNjIwMDC2NDIwtTc0dCYOFUAZGElNA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Input/output multiplexer bus</title><source>esp@cenet</source><creator>SEQUINE DENNIS R</creator><creatorcontrib>SEQUINE DENNIS R</creatorcontrib><description>An input/output ("I/O") system includes a plurality of input/output ("I/O") ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more electrical properties of one or more devices to be externally coupled to one or more of the I/O ports. The I/O multiplexer bus is coupled between the I/O ports and the measurement circuitry. The I/O multiplexer bus is programmable to selectively couple the measurement circuitry to any of the I/O ports.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081218&amp;DB=EPODOC&amp;CC=US&amp;NR=2008312857A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081218&amp;DB=EPODOC&amp;CC=US&amp;NR=2008312857A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SEQUINE DENNIS R</creatorcontrib><title>Input/output multiplexer bus</title><description>An input/output ("I/O") system includes a plurality of input/output ("I/O") ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more electrical properties of one or more devices to be externally coupled to one or more of the I/O ports. The I/O multiplexer bus is coupled between the I/O ports and the measurement circuitry. The I/O multiplexer bus is programmable to selectively couple the measurement circuitry to any of the I/O ports.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDxzCsoLdHPLy0BUgq5pTklmQU5qRWpRQpJpcU8DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-NNjIwMDC2NDIwtTc0dCYOFUAZGElNA</recordid><startdate>20081218</startdate><enddate>20081218</enddate><creator>SEQUINE DENNIS R</creator><scope>EVB</scope></search><sort><creationdate>20081218</creationdate><title>Input/output multiplexer bus</title><author>SEQUINE DENNIS R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008312857A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SEQUINE DENNIS R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SEQUINE DENNIS R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Input/output multiplexer bus</title><date>2008-12-18</date><risdate>2008</risdate><abstract>An input/output ("I/O") system includes a plurality of input/output ("I/O") ports, measurement circuitry, and an I/O multiplexer bus. The measurement circuitry is coupled to measure one or more electrical properties of one or more devices to be externally coupled to one or more of the I/O ports. The I/O multiplexer bus is coupled between the I/O ports and the measurement circuitry. The I/O multiplexer bus is programmable to selectively couple the measurement circuitry to any of the I/O ports.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Input/output multiplexer bus
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T03%3A59%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SEQUINE%20DENNIS%20R&rft.date=2008-12-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2008312857A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true