Real-Time, 3D, Non-Linear Microscope Measuring System and Method for Application of the Same

A real-time, 3D, non-linear microscope measuring system and method for examining a set of microscopic image points in different image planes. The system comprises a pulsed laser or parametric oscillator light source generating an examining optical signal, and is applicable to measure and/or photoche...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ROZSA BALAZS, OSVAY KAROLY, VIZI SZILVESZTER E, KALLO PETER, SZIPOCS ROBERT, KATONA GERGELY, FEKETE JULIA, VALENTA LASZLO, MAAK PAL
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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