TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS

A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a...

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Hauptverfasser:	HIDALGO AUGUST JON, OVERNEY GREGOR T, MILLER BRYAN DAVID
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PHYSICS
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creator	HIDALGO AUGUST JON OVERNEY GREGOR T MILLER BRYAN DAVID
description	A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008296490A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008296490A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008296490A13</originalsourceid><addsrcrecordid>eNrjZDAN8fR1VfB3U3Dz8XT3CFHwdQwOVggOcHUOCfL3dQ0JilQAkh7-LgqOfkAcEOAY5BgSGszDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-JDg40MDCyMLM1MLA0cDY2JUwUAjFkorA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS</title><source>esp@cenet</source><creator>HIDALGO AUGUST JON ; OVERNEY GREGOR T ; MILLER BRYAN DAVID</creator><creatorcontrib>HIDALGO AUGUST JON ; OVERNEY GREGOR T ; MILLER BRYAN DAVID</creatorcontrib><description>A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; PHYSICS</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081204&DB=EPODOC&CC=US&NR=2008296490A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081204&DB=EPODOC&CC=US&NR=2008296490A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIDALGO AUGUST JON</creatorcontrib><creatorcontrib>OVERNEY GREGOR T</creatorcontrib><creatorcontrib>MILLER BRYAN DAVID</creatorcontrib><title>TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS</title><description>A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAN8fR1VfB3U3Dz8XT3CFHwdQwOVggOcHUOCfL3dQ0JilQAkh7-LgqOfkAcEOAY5BgSGszDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-JDg40MDCyMLM1MLA0cDY2JUwUAjFkorA</recordid><startdate>20081204</startdate><enddate>20081204</enddate><creator>HIDALGO AUGUST JON</creator><creator>OVERNEY GREGOR T</creator><creator>MILLER BRYAN DAVID</creator><scope>EVB</scope></search><sort><creationdate>20081204</creationdate><title>TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS</title><author>HIDALGO AUGUST JON ; OVERNEY GREGOR T ; MILLER BRYAN DAVID</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008296490A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>HIDALGO AUGUST JON</creatorcontrib><creatorcontrib>OVERNEY GREGOR T</creatorcontrib><creatorcontrib>MILLER BRYAN DAVID</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIDALGO AUGUST JON</au><au>OVERNEY GREGOR T</au><au>MILLER BRYAN DAVID</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS</title><date>2008-12-04</date><risdate>2008</risdate><abstract>A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.</abstract><oa>free_for_read</oa></addata></record>
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subjects	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PHYSICS
title	TIME OF FLIGHT MASS SPECTROMETRY METHOD AND APPARATUS
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T08%3A27%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIDALGO%20AUGUST%20JON&rft.date=2008-12-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2008296490A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true