SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD
A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of...
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| creator | YANG KENGIA HUANG YI-SHENG SHIN BEN CHANG CHIHIEN |
| description | A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2008281536A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2008281536A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2008281536A13</originalsourceid><addsrcrecordid>eNrjZHAKdvX1dPb3cwl1DvEPUnAOUNBw9gxyDvUMUQgI8ndy1VQIcQ0OUfB19HN0d_V19QtRCI4MDnH1VXD0c1HwdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBgYWRhaGpsZmjobGxKkCAKAhLAc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD</title><source>esp@cenet</source><creator>YANG KENGIA ; HUANG YI-SHENG ; SHIN BEN ; CHANG CHIHIEN</creator><creatorcontrib>YANG KENGIA ; HUANG YI-SHENG ; SHIN BEN ; CHANG CHIHIEN</creatorcontrib><description>A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081113&DB=EPODOC&CC=US&NR=2008281536A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081113&DB=EPODOC&CC=US&NR=2008281536A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YANG KENGIA</creatorcontrib><creatorcontrib>HUANG YI-SHENG</creatorcontrib><creatorcontrib>SHIN BEN</creatorcontrib><creatorcontrib>CHANG CHIHIEN</creatorcontrib><title>SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD</title><description>A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAKdvX1dPb3cwl1DvEPUnAOUNBw9gxyDvUMUQgI8ndy1VQIcQ0OUfB19HN0d_V19QtRCI4MDnH1VXD0c1HwdQ3x8HfhYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBgYWRhaGpsZmjobGxKkCAKAhLAc</recordid><startdate>20081113</startdate><enddate>20081113</enddate><creator>YANG KENGIA</creator><creator>HUANG YI-SHENG</creator><creator>SHIN BEN</creator><creator>CHANG CHIHIEN</creator><scope>EVB</scope></search><sort><creationdate>20081113</creationdate><title>SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD</title><author>YANG KENGIA ; HUANG YI-SHENG ; SHIN BEN ; CHANG CHIHIEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2008281536A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YANG KENGIA</creatorcontrib><creatorcontrib>HUANG YI-SHENG</creatorcontrib><creatorcontrib>SHIN BEN</creatorcontrib><creatorcontrib>CHANG CHIHIEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YANG KENGIA</au><au>HUANG YI-SHENG</au><au>SHIN BEN</au><au>CHANG CHIHIEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD</title><date>2008-11-13</date><risdate>2008</risdate><abstract>A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | SEMICONDUCTOR CP (CIRCUIT PROBE) TEST MANAGEMENT SYSTEM AND METHOD |
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