METHODS FOR FABRICATING SEMICONDUCTOR DEVICE STRUCTURES WITH REDUCED SUSCEPTIBILITY TO LATCH-UP AND SEMICONDUCTOR DEVICE STRUCTURES FORMED BY THE METHODS
Semiconductor methods and device structures for suppressing latch-up in bulk CMOS devices. The method comprises forming a trench in the semiconductor material of the substrate with first sidewalls disposed between a pair of doped wells, also defined in the semiconductor material of the substrate. Th...
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