System and Method for Instrument Calibration

Methods for generating a calibration factor and for calibrating are provided whereby interstitial spacing between support locations of a platform is used to embed a detectable material, emissions from which are used to generate the calibration factor. In some embodiments, the external space, outer p...

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1. Verfasser: GUNSTREAM STEPHEN J
Format: Patent
Sprache:eng
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Zusammenfassung:Methods for generating a calibration factor and for calibrating are provided whereby interstitial spacing between support locations of a platform is used to embed a detectable material, emissions from which are used to generate the calibration factor. In some embodiments, the external space, outer perimeter, and other areas of a platform are used to embed detection materials for the normalization, calibration, correction, compensation, or other method of adjustment for detected emission data. The emission data can be taken from an assay, amplification, reaction, analysis, or other process, for example, from a PCR run or other reaction. By calibrating or adjusting the sample support with the detected emission data, a more efficient detection of the assay, amplification, reaction, analysis, or other process, can be achieved.