SPECTRAL IMAGING DEVICE

Systems and methods for spectral imaging are disclosed. Such spectral imaging can be used to determine properties of a subject material at different locations upon the surface and/or within the material. For example, strain and/or stress within an imaged area of the material can be determined. A sys...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KHIZHNYAK ANATOLIY I, HEEG BAUKE, ABBISS JOHN B, CLARKE DAVID R
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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