Methods and Apparatus for Inline Variability Measurement of Integrated Circuit Components

An integrated circuit device is provided including at least one first array configuration of integrated circuit components comprising a mxn array of FETs, without specified internal connections between the integrated circuit components, wherein m is greater than two. The integrated circuit device fu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HAENSCH WILFRIED E, GETTINGS KAREN M.G.V, KETCHEN MARK B, BHUSHAN MANJUL, JI BRIAN L
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!